JPS57173961A - Integrated circuit - Google Patents

Integrated circuit

Info

Publication number
JPS57173961A
JPS57173961A JP56058146A JP5814681A JPS57173961A JP S57173961 A JPS57173961 A JP S57173961A JP 56058146 A JP56058146 A JP 56058146A JP 5814681 A JP5814681 A JP 5814681A JP S57173961 A JPS57173961 A JP S57173961A
Authority
JP
Japan
Prior art keywords
signals
pads
signal
integrated circuit
selector circuit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP56058146A
Other languages
English (en)
Inventor
Tadao Harashima
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Priority to JP56058146A priority Critical patent/JPS57173961A/ja
Publication of JPS57173961A publication Critical patent/JPS57173961A/ja
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/2205—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested
    • G06F11/221—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested to test buses, lines or interfaces, e.g. stuck-at or open line faults
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/316—Testing of analog circuits

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Quality & Reliability (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Semiconductor Integrated Circuits (AREA)
JP56058146A 1981-04-17 1981-04-17 Integrated circuit Pending JPS57173961A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP56058146A JPS57173961A (en) 1981-04-17 1981-04-17 Integrated circuit

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP56058146A JPS57173961A (en) 1981-04-17 1981-04-17 Integrated circuit

Publications (1)

Publication Number Publication Date
JPS57173961A true JPS57173961A (en) 1982-10-26

Family

ID=13075841

Family Applications (1)

Application Number Title Priority Date Filing Date
JP56058146A Pending JPS57173961A (en) 1981-04-17 1981-04-17 Integrated circuit

Country Status (1)

Country Link
JP (1) JPS57173961A (ja)

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