JPS57164571A - Semiconductro integrated circuit device - Google Patents
Semiconductro integrated circuit deviceInfo
- Publication number
- JPS57164571A JPS57164571A JP5088281A JP5088281A JPS57164571A JP S57164571 A JPS57164571 A JP S57164571A JP 5088281 A JP5088281 A JP 5088281A JP 5088281 A JP5088281 A JP 5088281A JP S57164571 A JPS57164571 A JP S57164571A
- Authority
- JP
- Japan
- Prior art keywords
- pad
- integrated circuit
- circuit device
- protecting circuit
- constitution
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having at least one potential-jump barrier or surface barrier; including integrated passive circuit elements with at least one potential-jump barrier or surface barrier
- H01L27/0203—Particular design considerations for integrated circuits
- H01L27/0248—Particular design considerations for integrated circuits for electrical or thermal protection, e.g. electrostatic discharge [ESD] protection
- H01L27/0251—Particular design considerations for integrated circuits for electrical or thermal protection, e.g. electrostatic discharge [ESD] protection for MOS devices
- H01L27/0255—Particular design considerations for integrated circuits for electrical or thermal protection, e.g. electrostatic discharge [ESD] protection for MOS devices using diodes as protective elements
Landscapes
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Bipolar Integrated Circuits (AREA)
Abstract
PURPOSE:To obtain an input protecting circuit strong for the fusing by overcurrent and the breakdown, by positioning a protecting diode immediately under a pad part. CONSTITUTION:To transmit electric signal from outside into the active element in a semiconductor integrated circuit device formed on the first conductive semiconductor substrate 10, the pad 100 constituted of a conductive material 101 is provided on an insulating film 11 of the semiconductor substrate 10. Then, a contact hole 201 is formed on the insulating film 11 immediately under the pad 100 with the second conductive semiconductor region 202 provided thereunder to form a diode for the constitution of an input protecting circuit. Thus, the wiring layer of the conductive material 101 from the pad to protecting circuit becomes shortest to sufficiently enlarge the contact hole 201.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP5088281A JPS57164571A (en) | 1981-04-02 | 1981-04-02 | Semiconductro integrated circuit device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP5088281A JPS57164571A (en) | 1981-04-02 | 1981-04-02 | Semiconductro integrated circuit device |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS57164571A true JPS57164571A (en) | 1982-10-09 |
Family
ID=12871094
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP5088281A Pending JPS57164571A (en) | 1981-04-02 | 1981-04-02 | Semiconductro integrated circuit device |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS57164571A (en) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4821089A (en) * | 1985-10-15 | 1989-04-11 | American Telephone And Telegraph Company, At&T Laboratories | Protection of IGFET integrated circuits from electrostatic discharge |
EP0337482A2 (en) * | 1988-04-14 | 1989-10-18 | Kabushiki Kaisha Toshiba | Semiconducteur protection device |
US4876584A (en) * | 1986-09-10 | 1989-10-24 | British Aerospace Plc | Electrostatic discharge protection circuit |
-
1981
- 1981-04-02 JP JP5088281A patent/JPS57164571A/en active Pending
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4821089A (en) * | 1985-10-15 | 1989-04-11 | American Telephone And Telegraph Company, At&T Laboratories | Protection of IGFET integrated circuits from electrostatic discharge |
US4876584A (en) * | 1986-09-10 | 1989-10-24 | British Aerospace Plc | Electrostatic discharge protection circuit |
EP0337482A2 (en) * | 1988-04-14 | 1989-10-18 | Kabushiki Kaisha Toshiba | Semiconducteur protection device |
US5148249A (en) * | 1988-04-14 | 1992-09-15 | Kabushiki Kaisha Toshiba | Semiconductor protection device |
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