JPS57163876A - Measuring method for latch-up dielectric strength of complementary mos integrated-circuit device - Google Patents
Measuring method for latch-up dielectric strength of complementary mos integrated-circuit deviceInfo
- Publication number
- JPS57163876A JPS57163876A JP56049544A JP4954481A JPS57163876A JP S57163876 A JPS57163876 A JP S57163876A JP 56049544 A JP56049544 A JP 56049544A JP 4954481 A JP4954481 A JP 4954481A JP S57163876 A JPS57163876 A JP S57163876A
- Authority
- JP
- Japan
- Prior art keywords
- latch
- capacitor
- dielectric strength
- voltage
- measured
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/26—Testing of individual semiconductor devices
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP56049544A JPS57163876A (en) | 1981-03-31 | 1981-03-31 | Measuring method for latch-up dielectric strength of complementary mos integrated-circuit device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP56049544A JPS57163876A (en) | 1981-03-31 | 1981-03-31 | Measuring method for latch-up dielectric strength of complementary mos integrated-circuit device |
Related Child Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP63196741A Division JPH01180472A (ja) | 1988-08-05 | 1988-08-05 | 半導体集積回路装置のラッチアップ耐量の測定方法及び測定装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS57163876A true JPS57163876A (en) | 1982-10-08 |
JPH0147751B2 JPH0147751B2 (ja) | 1989-10-16 |
Family
ID=12834128
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP56049544A Granted JPS57163876A (en) | 1981-03-31 | 1981-03-31 | Measuring method for latch-up dielectric strength of complementary mos integrated-circuit device |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS57163876A (ja) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6144370A (ja) * | 1984-08-07 | 1986-03-04 | Mitsubishi Electric Corp | 静電気破壊試験方法 |
JPS61256266A (ja) * | 1985-05-09 | 1986-11-13 | Rohm Co Ltd | Cmos素子のラツチアツプ現象測定方法 |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5644866A (en) * | 1979-09-21 | 1981-04-24 | Hitachi Ltd | Measurement of breakdown strength of latch circuit |
-
1981
- 1981-03-31 JP JP56049544A patent/JPS57163876A/ja active Granted
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5644866A (en) * | 1979-09-21 | 1981-04-24 | Hitachi Ltd | Measurement of breakdown strength of latch circuit |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6144370A (ja) * | 1984-08-07 | 1986-03-04 | Mitsubishi Electric Corp | 静電気破壊試験方法 |
JPS61256266A (ja) * | 1985-05-09 | 1986-11-13 | Rohm Co Ltd | Cmos素子のラツチアツプ現象測定方法 |
Also Published As
Publication number | Publication date |
---|---|
JPH0147751B2 (ja) | 1989-10-16 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
ATE303601T1 (de) | Gerät und verfahren zur erfassung von kennzeichnenden parametern von ladungsspeichern | |
IE781295L (en) | Generation of pulses | |
HU214419B (hu) | Eljárás és készülék szigetelési rendszer állapotának vizsgálatára | |
KR920010399A (ko) | 전원 제어 방법 및 장치 | |
JPS57163876A (en) | Measuring method for latch-up dielectric strength of complementary mos integrated-circuit device | |
JPS5780577A (en) | Testing method of semiconductor | |
JPS5644868A (en) | Residual amount indicating device of battery | |
US5410239A (en) | Battery charger with capacity monitor | |
JPS5613598A (en) | Sample holding circuit | |
GB1599076A (en) | Apparatus for recharging dry electric power cells | |
JPS5686365A (en) | Salt injury predicting device | |
JPS54102923A (en) | Driving circiut | |
JPS56128466A (en) | Measurement of switching loss for electric power semiconductor element | |
JPS5682920A (en) | Electric equipment | |
JPS6413473A (en) | Electrostatic breakdown testing device | |
JPS6464533A (en) | Charge | |
RU2025836C1 (ru) | Устройство для контроля аккумуляторной батареи | |
JPS5786075A (en) | Electronic circuit | |
JPS5622976A (en) | Life time deciding method for nickel-cadmium accumulator | |
KR890002553Y1 (ko) | 배터리의 충전 제어회로 | |
JPS57119278A (en) | Power source device for electronic watch | |
JPS57162362A (en) | Measuring method for latchup withstand amount of complementary mos integrated circuit device | |
JPS5787626A (en) | Driving circuit for self-distinguishing type switch element | |
JPS56132019A (en) | High-voltage pulse circuit | |
JPS555546A (en) | Detection circuit for ac supply voltage |