JPS57153250A - Measuring apparatus of spectral transmissivity of polarizable sample - Google Patents

Measuring apparatus of spectral transmissivity of polarizable sample

Info

Publication number
JPS57153250A
JPS57153250A JP3985281A JP3985281A JPS57153250A JP S57153250 A JPS57153250 A JP S57153250A JP 3985281 A JP3985281 A JP 3985281A JP 3985281 A JP3985281 A JP 3985281A JP S57153250 A JPS57153250 A JP S57153250A
Authority
JP
Japan
Prior art keywords
light
sample
made incident
incident
spectroscope
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP3985281A
Other languages
English (en)
Japanese (ja)
Other versions
JPS6244215B2 (enExample
Inventor
Osamu Akiyama
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shimadzu Corp
Shimazu Seisakusho KK
Original Assignee
Shimadzu Corp
Shimazu Seisakusho KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shimadzu Corp, Shimazu Seisakusho KK filed Critical Shimadzu Corp
Priority to JP3985281A priority Critical patent/JPS57153250A/ja
Publication of JPS57153250A publication Critical patent/JPS57153250A/ja
Publication of JPS6244215B2 publication Critical patent/JPS6244215B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/255—Details, e.g. use of specially adapted sources, lighting or optical systems

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
JP3985281A 1981-03-18 1981-03-18 Measuring apparatus of spectral transmissivity of polarizable sample Granted JPS57153250A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP3985281A JPS57153250A (en) 1981-03-18 1981-03-18 Measuring apparatus of spectral transmissivity of polarizable sample

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP3985281A JPS57153250A (en) 1981-03-18 1981-03-18 Measuring apparatus of spectral transmissivity of polarizable sample

Publications (2)

Publication Number Publication Date
JPS57153250A true JPS57153250A (en) 1982-09-21
JPS6244215B2 JPS6244215B2 (enExample) 1987-09-18

Family

ID=12564490

Family Applications (1)

Application Number Title Priority Date Filing Date
JP3985281A Granted JPS57153250A (en) 1981-03-18 1981-03-18 Measuring apparatus of spectral transmissivity of polarizable sample

Country Status (1)

Country Link
JP (1) JPS57153250A (enExample)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63236944A (ja) * 1987-03-25 1988-10-03 Shimadzu Corp 原子吸光分析装置
CN103512864A (zh) * 2012-06-25 2014-01-15 中国科学院微电子研究所 利用平行光测量衬底反射率和透射率的光学量测系统
WO2019077932A1 (ja) * 2017-10-19 2019-04-25 コニカミノルタ株式会社 回折光除去スリット及びこれを用いた光学式検体検出システム

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63236944A (ja) * 1987-03-25 1988-10-03 Shimadzu Corp 原子吸光分析装置
CN103512864A (zh) * 2012-06-25 2014-01-15 中国科学院微电子研究所 利用平行光测量衬底反射率和透射率的光学量测系统
CN103512864B (zh) * 2012-06-25 2016-07-06 中国科学院微电子研究所 利用平行光测量衬底反射率和透射率的光学量测系统
WO2019077932A1 (ja) * 2017-10-19 2019-04-25 コニカミノルタ株式会社 回折光除去スリット及びこれを用いた光学式検体検出システム
JPWO2019077932A1 (ja) * 2017-10-19 2020-11-05 コニカミノルタ株式会社 回折光除去スリット及びこれを用いた光学式検体検出システム
EP3683571A4 (en) * 2017-10-19 2020-11-25 Konica Minolta, Inc. DIFFRACTED LIGHT ELIMINATION SLOT AND OPTICAL SAMPLE DETECTION SYSTEM USING THE LATTER
US11169090B2 (en) 2017-10-19 2021-11-09 Konica Minolta, Inc. Diffracted light removal slit and optical sample detection system using same

Also Published As

Publication number Publication date
JPS6244215B2 (enExample) 1987-09-18

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