JPS57146158A - Eddy current flaw detecting device - Google Patents
Eddy current flaw detecting deviceInfo
- Publication number
- JPS57146158A JPS57146158A JP2991581A JP2991581A JPS57146158A JP S57146158 A JPS57146158 A JP S57146158A JP 2991581 A JP2991581 A JP 2991581A JP 2991581 A JP2991581 A JP 2991581A JP S57146158 A JPS57146158 A JP S57146158A
- Authority
- JP
- Japan
- Prior art keywords
- polar coordinate
- signals
- rotary angle
- flaw
- eddy current
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
- G01N27/72—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables
- G01N27/82—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws
- G01N27/90—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents
- G01N27/9046—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents by analysing electrical signals
Landscapes
- Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Electrochemistry (AREA)
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)
Abstract
PURPOSE:To set the direction of noise component for every material to be checked automatically, by utilizing the fact that the number of signals caused by the flaw among the signals outputted during the flaw detection in the continuous casting and the like is very small, extracting a constant number of outputs in a time series, and determining appropriate polar coordinate rotary angle. CONSTITUTION:The output signals of a detector 2, which is generated by the distribution of the eddy current caused in the material to be checked 5, are given to phase discriminators 4a and 4b. Component signals X and Y which cross to each other are obtained. Said signals X and Y are outputted to a computing and processing part 7. When the flaw detection has started, the polar coordinate rotary angle H is initially set at zero. When X and Y are inputted to a point N, linear approximation of the set is performed based on the information at the point N, while Y'=(tantheta)X' is obtained, and compensated rotary angle theta is obtained. Said compensated angle theta is added to H and H'=H+theta is used as an optimum polar coordinate rotary angle. Then the operation of the polar coordinate rotation is performed to obtain X' and Y', and they are displayed on a display part 10. In this constitution, even through the direction of the signal other than the flaw is changed, the optimum polar coordinate rotation can be readily performed.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2991581A JPS57146158A (en) | 1981-03-04 | 1981-03-04 | Eddy current flaw detecting device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2991581A JPS57146158A (en) | 1981-03-04 | 1981-03-04 | Eddy current flaw detecting device |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS57146158A true JPS57146158A (en) | 1982-09-09 |
JPS6314779B2 JPS6314779B2 (en) | 1988-04-01 |
Family
ID=12289282
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2991581A Granted JPS57146158A (en) | 1981-03-04 | 1981-03-04 | Eddy current flaw detecting device |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS57146158A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2010266215A (en) * | 2009-05-12 | 2010-11-25 | Toshiba Corp | Eddy current flaw detection signal evaluation device, and eddy current flaw detection testing device and method of evaluating eddy current flaw detection signal including the eddy current flaw detection signal evaluation device |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5225674A (en) * | 1975-08-21 | 1977-02-25 | Fujitsu Ltd | Image apparatus |
-
1981
- 1981-03-04 JP JP2991581A patent/JPS57146158A/en active Granted
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5225674A (en) * | 1975-08-21 | 1977-02-25 | Fujitsu Ltd | Image apparatus |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2010266215A (en) * | 2009-05-12 | 2010-11-25 | Toshiba Corp | Eddy current flaw detection signal evaluation device, and eddy current flaw detection testing device and method of evaluating eddy current flaw detection signal including the eddy current flaw detection signal evaluation device |
Also Published As
Publication number | Publication date |
---|---|
JPS6314779B2 (en) | 1988-04-01 |
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