JPS57146158A - Eddy current flaw detecting device - Google Patents

Eddy current flaw detecting device

Info

Publication number
JPS57146158A
JPS57146158A JP2991581A JP2991581A JPS57146158A JP S57146158 A JPS57146158 A JP S57146158A JP 2991581 A JP2991581 A JP 2991581A JP 2991581 A JP2991581 A JP 2991581A JP S57146158 A JPS57146158 A JP S57146158A
Authority
JP
Japan
Prior art keywords
polar coordinate
signals
rotary angle
flaw
eddy current
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2991581A
Other languages
Japanese (ja)
Other versions
JPS6314779B2 (en
Inventor
Takao Sugimoto
Hiroshi Kawase
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Nippon Steel Corp
Original Assignee
Hitachi Ltd
Nippon Steel Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd, Nippon Steel Corp filed Critical Hitachi Ltd
Priority to JP2991581A priority Critical patent/JPS57146158A/en
Publication of JPS57146158A publication Critical patent/JPS57146158A/en
Publication of JPS6314779B2 publication Critical patent/JPS6314779B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/72Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables
    • G01N27/82Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws
    • G01N27/90Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents
    • G01N27/9046Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents by analysing electrical signals

Landscapes

  • Chemical & Material Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Electrochemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)

Abstract

PURPOSE:To set the direction of noise component for every material to be checked automatically, by utilizing the fact that the number of signals caused by the flaw among the signals outputted during the flaw detection in the continuous casting and the like is very small, extracting a constant number of outputs in a time series, and determining appropriate polar coordinate rotary angle. CONSTITUTION:The output signals of a detector 2, which is generated by the distribution of the eddy current caused in the material to be checked 5, are given to phase discriminators 4a and 4b. Component signals X and Y which cross to each other are obtained. Said signals X and Y are outputted to a computing and processing part 7. When the flaw detection has started, the polar coordinate rotary angle H is initially set at zero. When X and Y are inputted to a point N, linear approximation of the set is performed based on the information at the point N, while Y'=(tantheta)X' is obtained, and compensated rotary angle theta is obtained. Said compensated angle theta is added to H and H'=H+theta is used as an optimum polar coordinate rotary angle. Then the operation of the polar coordinate rotation is performed to obtain X' and Y', and they are displayed on a display part 10. In this constitution, even through the direction of the signal other than the flaw is changed, the optimum polar coordinate rotation can be readily performed.
JP2991581A 1981-03-04 1981-03-04 Eddy current flaw detecting device Granted JPS57146158A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2991581A JPS57146158A (en) 1981-03-04 1981-03-04 Eddy current flaw detecting device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2991581A JPS57146158A (en) 1981-03-04 1981-03-04 Eddy current flaw detecting device

Publications (2)

Publication Number Publication Date
JPS57146158A true JPS57146158A (en) 1982-09-09
JPS6314779B2 JPS6314779B2 (en) 1988-04-01

Family

ID=12289282

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2991581A Granted JPS57146158A (en) 1981-03-04 1981-03-04 Eddy current flaw detecting device

Country Status (1)

Country Link
JP (1) JPS57146158A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010266215A (en) * 2009-05-12 2010-11-25 Toshiba Corp Eddy current flaw detection signal evaluation device, and eddy current flaw detection testing device and method of evaluating eddy current flaw detection signal including the eddy current flaw detection signal evaluation device

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5225674A (en) * 1975-08-21 1977-02-25 Fujitsu Ltd Image apparatus

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5225674A (en) * 1975-08-21 1977-02-25 Fujitsu Ltd Image apparatus

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010266215A (en) * 2009-05-12 2010-11-25 Toshiba Corp Eddy current flaw detection signal evaluation device, and eddy current flaw detection testing device and method of evaluating eddy current flaw detection signal including the eddy current flaw detection signal evaluation device

Also Published As

Publication number Publication date
JPS6314779B2 (en) 1988-04-01

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