JPS57137867A - Pattern generator input and output switching control for tester - Google Patents

Pattern generator input and output switching control for tester

Info

Publication number
JPS57137867A
JPS57137867A JP56022928A JP2292881A JPS57137867A JP S57137867 A JPS57137867 A JP S57137867A JP 56022928 A JP56022928 A JP 56022928A JP 2292881 A JP2292881 A JP 2292881A JP S57137867 A JPS57137867 A JP S57137867A
Authority
JP
Japan
Prior art keywords
pattern
input
output
data
memory
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP56022928A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0211872B2 (enrdf_load_stackoverflow
Inventor
Yoshio Ouchida
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi High Tech Corp
Original Assignee
Hitachi Electronics Engineering Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Electronics Engineering Co Ltd filed Critical Hitachi Electronics Engineering Co Ltd
Priority to JP56022928A priority Critical patent/JPS57137867A/ja
Publication of JPS57137867A publication Critical patent/JPS57137867A/ja
Publication of JPH0211872B2 publication Critical patent/JPH0211872B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
JP56022928A 1981-02-20 1981-02-20 Pattern generator input and output switching control for tester Granted JPS57137867A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP56022928A JPS57137867A (en) 1981-02-20 1981-02-20 Pattern generator input and output switching control for tester

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP56022928A JPS57137867A (en) 1981-02-20 1981-02-20 Pattern generator input and output switching control for tester

Publications (2)

Publication Number Publication Date
JPS57137867A true JPS57137867A (en) 1982-08-25
JPH0211872B2 JPH0211872B2 (enrdf_load_stackoverflow) 1990-03-16

Family

ID=12096286

Family Applications (1)

Application Number Title Priority Date Filing Date
JP56022928A Granted JPS57137867A (en) 1981-02-20 1981-02-20 Pattern generator input and output switching control for tester

Country Status (1)

Country Link
JP (1) JPS57137867A (enrdf_load_stackoverflow)

Also Published As

Publication number Publication date
JPH0211872B2 (enrdf_load_stackoverflow) 1990-03-16

Similar Documents

Publication Publication Date Title
EP0356999A3 (en) Memory tester
JPS5585265A (en) Function test evaluation device for integrated circuit
JPS57137867A (en) Pattern generator input and output switching control for tester
JPS5527907A (en) Logic tester
JPS55113200A (en) Checking method for ic memory
JPS5423343A (en) Microprogram controller
JPS5447443A (en) Semiconductor memory unit
JPS5286746A (en) Pulse count readout control circuit
JPS5476024A (en) Test device for semiconductor memory
JPS56168269A (en) Logical device
JPS5556262A (en) Operation hysteresis retention system
JPS5384437A (en) Control system for test pattern generation
JPS5549757A (en) Test method of testing shift path
JPS57169809A (en) Programmable logic controller
JPS5698796A (en) High-speed memory test system
JPS57103538A (en) Digital input circuit
JPS5567856A (en) Memory device
JPS6448297A (en) Dram controller
JPS56127253A (en) Test pattern generator
JPS54122944A (en) Logic circuit
JPS5712499A (en) Prom read/write control device
JPS55135762A (en) Ic test unit
JPS5692471A (en) Test device
JPS6045375B2 (ja) Ｉｃ試験器用タイミング発生装置
JPS56157545A (en) Logical operation circuit