JPS57122560A - Semiconductor device - Google Patents

Semiconductor device

Info

Publication number
JPS57122560A
JPS57122560A JP20375581A JP20375581A JPS57122560A JP S57122560 A JPS57122560 A JP S57122560A JP 20375581 A JP20375581 A JP 20375581A JP 20375581 A JP20375581 A JP 20375581A JP S57122560 A JPS57122560 A JP S57122560A
Authority
JP
Japan
Prior art keywords
film
resistor
preventing
polysilicon
pinhole
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP20375581A
Other languages
Japanese (ja)
Inventor
Tatsumi Shirasu
Kazuo Yudasaka
Akihiro Tomosawa
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP20375581A priority Critical patent/JPS57122560A/en
Publication of JPS57122560A publication Critical patent/JPS57122560A/en
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/02Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
    • H01L27/04Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body

Landscapes

  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Formation Of Insulating Films (AREA)
  • Semiconductor Integrated Circuits (AREA)

Abstract

PURPOSE:To improve the yield of a semiconductor device in an IC or the like having a high resistance made of polysilicon, by covering an insulating film which prevents a phosphorus-dope from a PSG film on the upper surface of a resistor, thereby preventing the characteristic change of the resistor and the shortcircuit via a pinhole. CONSTITUTION:A polysilicon layer 3 and wiring polysilicon layers 4, 5 are formed to become resistors via an SiO2 film 2 on a P type substrate 1 formed with an element such as a diode, and a PSG film 6 is covered thereon. Then, the film 6 on the layers 3, 5 is removed, B ions are then inplanted and doped, and a CVD SiO2 film 8 is then covered thereon. Therefore, the doped impurity is annealed at a high temperature. Subsequently, a hole is formed at the connecting part of the electrode contact part with the wire, and aluminum electrodes 9-12 are formed. In this manner, when the doped impurity is redistributed and diffused (annealed), it can prevent the doping of the phosphorus scattered from the PSG film in the resistor, thereby preventing the variation in the electric characteristics due to the change in the resistance value. Even if a pinhole 7 is produced in the film 6, the latter can be insulated via the film 8, thereby preventing the shortcircuit trouble.
JP20375581A 1981-12-18 1981-12-18 Semiconductor device Pending JPS57122560A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP20375581A JPS57122560A (en) 1981-12-18 1981-12-18 Semiconductor device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP20375581A JPS57122560A (en) 1981-12-18 1981-12-18 Semiconductor device

Related Parent Applications (1)

Application Number Title Priority Date Filing Date
JP4104474A Division JPS5725981B2 (en) 1974-04-15 1974-04-15

Publications (1)

Publication Number Publication Date
JPS57122560A true JPS57122560A (en) 1982-07-30

Family

ID=16479296

Family Applications (1)

Application Number Title Priority Date Filing Date
JP20375581A Pending JPS57122560A (en) 1981-12-18 1981-12-18 Semiconductor device

Country Status (1)

Country Link
JP (1) JPS57122560A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4843590A (en) * 1986-05-29 1989-06-27 Hewlett-Packard Company History stack
JPH03187255A (en) * 1989-12-15 1991-08-15 Mitsubishi Electric Corp Fabrication of semiconductor device

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5725981A (en) * 1980-07-24 1982-02-10 Canon Inc Electronic appliance with printer

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5725981A (en) * 1980-07-24 1982-02-10 Canon Inc Electronic appliance with printer

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4843590A (en) * 1986-05-29 1989-06-27 Hewlett-Packard Company History stack
JPH03187255A (en) * 1989-12-15 1991-08-15 Mitsubishi Electric Corp Fabrication of semiconductor device

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