JPS57118166A - Measuring apparatus for waveform width - Google Patents
Measuring apparatus for waveform widthInfo
- Publication number
- JPS57118166A JPS57118166A JP309381A JP309381A JPS57118166A JP S57118166 A JPS57118166 A JP S57118166A JP 309381 A JP309381 A JP 309381A JP 309381 A JP309381 A JP 309381A JP S57118166 A JPS57118166 A JP S57118166A
- Authority
- JP
- Japan
- Prior art keywords
- waveform
- level
- observation
- circuit
- peak value
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
- G01R29/02—Measuring characteristics of individual pulses, e.g. deviation from pulse flatness, rise time or duration
- G01R29/027—Indicating that a pulse characteristic is either above or below a predetermined value or within or beyond a predetermined range of values
- G01R29/0273—Indicating that a pulse characteristic is either above or below a predetermined value or within or beyond a predetermined range of values the pulse characteristic being duration, i.e. width (indicating that frequency of pulses is above or below a certain limit)
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Measurement Of Current Or Voltage (AREA)
Abstract
PURPOSE:To measure a waveform width easily and accurately even if the peak value of a waveform to be measured is changed, by using an attenuated waveform, which is obtained by attenuating an observation waveform, together with the observation waveform. CONSTITUTION:An input observation waveform is attenuated to 1/2 by an attenuator 1 and has the peak value held by a peak hold circuit 2, and this peak value and the observation waveform are compared in level with each other by a comparator 3. Similarly, the output of a peak hold circuit 5 is inputted together with the observation waveform to a comparator 4, and they are compared in level with each other. Outputs of comparators 3 and 4 are inputted to an AND circuit 7 through an AND circuit 6; and only when the output of the AND circuit 6 is 1, clock pulses from a pulse generator 8 are supplied to a counter 9. Its count value is raised twice to obtain the half-amplitude level of a waveform to be measured. Thus, the threshold level is set to a prescribed level for the peak value of the observation waveform to measure the waveform width accurately.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP309381A JPS57118166A (en) | 1981-01-14 | 1981-01-14 | Measuring apparatus for waveform width |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP309381A JPS57118166A (en) | 1981-01-14 | 1981-01-14 | Measuring apparatus for waveform width |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS57118166A true JPS57118166A (en) | 1982-07-22 |
Family
ID=11547721
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP309381A Pending JPS57118166A (en) | 1981-01-14 | 1981-01-14 | Measuring apparatus for waveform width |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS57118166A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH02259475A (en) * | 1989-03-31 | 1990-10-22 | Yokogawa Electric Corp | Half-width measuring circuit |
-
1981
- 1981-01-14 JP JP309381A patent/JPS57118166A/en active Pending
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH02259475A (en) * | 1989-03-31 | 1990-10-22 | Yokogawa Electric Corp | Half-width measuring circuit |
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