JPS53102784A - Distribution measuring instrument of sampling form - Google Patents

Distribution measuring instrument of sampling form

Info

Publication number
JPS53102784A
JPS53102784A JP1708077A JP1708077A JPS53102784A JP S53102784 A JPS53102784 A JP S53102784A JP 1708077 A JP1708077 A JP 1708077A JP 1708077 A JP1708077 A JP 1708077A JP S53102784 A JPS53102784 A JP S53102784A
Authority
JP
Japan
Prior art keywords
measuring instrument
distribution measuring
sampling form
pulse
sampling
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP1708077A
Other languages
Japanese (ja)
Other versions
JPS5721144B2 (en
Inventor
Naohisa Nakaya
Tetsuya Miki
Kazuo Nagafune
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Iwatsu Electric Co Ltd
Nippon Telegraph and Telephone Corp
Original Assignee
Iwatsu Electric Co Ltd
Nippon Telegraph and Telephone Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Iwatsu Electric Co Ltd, Nippon Telegraph and Telephone Corp filed Critical Iwatsu Electric Co Ltd
Priority to JP1708077A priority Critical patent/JPS53102784A/en
Publication of JPS53102784A publication Critical patent/JPS53102784A/en
Publication of JPS5721144B2 publication Critical patent/JPS5721144B2/ja
Granted legal-status Critical Current

Links

Abstract

PURPOSE: To enable to measure the jitter distribution of input pulse, by converting input pulse to low repeating pulse and counting the pulse generating cumulative frequency more than set up level.
COPYRIGHT: (C)1978,JPO&Japio
JP1708077A 1977-02-21 1977-02-21 Distribution measuring instrument of sampling form Granted JPS53102784A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1708077A JPS53102784A (en) 1977-02-21 1977-02-21 Distribution measuring instrument of sampling form

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1708077A JPS53102784A (en) 1977-02-21 1977-02-21 Distribution measuring instrument of sampling form

Publications (2)

Publication Number Publication Date
JPS53102784A true JPS53102784A (en) 1978-09-07
JPS5721144B2 JPS5721144B2 (en) 1982-05-06

Family

ID=11933989

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1708077A Granted JPS53102784A (en) 1977-02-21 1977-02-21 Distribution measuring instrument of sampling form

Country Status (1)

Country Link
JP (1) JPS53102784A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2002050557A1 (en) * 2000-12-11 2002-06-27 Advantest Corporation Quantity of jitter calculator, and tester
WO2005076021A1 (en) * 2004-02-05 2005-08-18 Advantest Corporation Measurement instrument, measurement method, and test instrument
JP2006343345A (en) * 2006-07-25 2006-12-21 Oki Electric Ind Co Ltd Semiconductor integrated circuit and its jitter measuring method

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63125773A (en) * 1986-11-14 1988-05-28 株式会社　応用企画 Concrete mold frame
JPS63125774A (en) * 1986-11-14 1988-05-28 株式会社　応用企画 Concrete mold frame
JPS646462A (en) * 1987-06-29 1989-01-11 Oyo Kikaku Kk Concrete retaining mold

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2002050557A1 (en) * 2000-12-11 2002-06-27 Advantest Corporation Quantity of jitter calculator, and tester
US6768954B2 (en) 2000-12-11 2004-07-27 Advantest Corporation Jitter quantity calculator and tester
WO2005076021A1 (en) * 2004-02-05 2005-08-18 Advantest Corporation Measurement instrument, measurement method, and test instrument
US7262627B2 (en) 2004-02-05 2007-08-28 Advantest Corporation Measuring apparatus, measuring method, and test apparatus
JP2006343345A (en) * 2006-07-25 2006-12-21 Oki Electric Ind Co Ltd Semiconductor integrated circuit and its jitter measuring method

Also Published As

Publication number Publication date
JPS5721144B2 (en) 1982-05-06

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