JPS57111466A - Automatic wiring continuity test system - Google Patents

Automatic wiring continuity test system

Info

Publication number
JPS57111466A
JPS57111466A JP55187853A JP18785380A JPS57111466A JP S57111466 A JPS57111466 A JP S57111466A JP 55187853 A JP55187853 A JP 55187853A JP 18785380 A JP18785380 A JP 18785380A JP S57111466 A JPS57111466 A JP S57111466A
Authority
JP
Japan
Prior art keywords
wiring
series
test
connecting terminal
voltage
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP55187853A
Other languages
Japanese (ja)
Other versions
JPS6363068B2 (en
Inventor
Mitsuo Harasawa
Minoru Iijima
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP55187853A priority Critical patent/JPS57111466A/en
Publication of JPS57111466A publication Critical patent/JPS57111466A/en
Publication of JPS6363068B2 publication Critical patent/JPS6363068B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
    • G01R31/54—Testing for continuity
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
    • G01R31/52—Testing for short-circuits, leakage current or ground faults
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
    • G01R31/58—Testing of lines, cables or conductors

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)

Abstract

PURPOSE:To reduce the time required for a test, by storing the connecting terminal information, producing a wiring test series from the data of the stored connecting terminal information and then comparing the wiring test series with a device to be tested to decide the quality of the wiring. CONSTITUTION:The connection between the wiring information 1 and connecting terminal information 2 is stored in a memory 3 via a processor 4 and then reorganized as a correct test series by the processor 4 to be recorded to a wiring test file 5. A wiring tester 6 reads each wiring test series out of the file 5 and applies the voltage to either connecting terminal of a device to be tested to judge whether or not the same voltage emerges at other connecting terminals of the series. For instance, a series of q-j-k is nodefective, but no voltage emerges at (s) and at (i) a (l) in case the voltage is applied to (i) or (l) and to (s) respectively for a series of i-l-s. Thus an error is displayed. As a result, the test time can be reduced.
JP55187853A 1980-12-29 1980-12-29 Automatic wiring continuity test system Granted JPS57111466A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP55187853A JPS57111466A (en) 1980-12-29 1980-12-29 Automatic wiring continuity test system

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP55187853A JPS57111466A (en) 1980-12-29 1980-12-29 Automatic wiring continuity test system

Publications (2)

Publication Number Publication Date
JPS57111466A true JPS57111466A (en) 1982-07-10
JPS6363068B2 JPS6363068B2 (en) 1988-12-06

Family

ID=16213356

Family Applications (1)

Application Number Title Priority Date Filing Date
JP55187853A Granted JPS57111466A (en) 1980-12-29 1980-12-29 Automatic wiring continuity test system

Country Status (1)

Country Link
JP (1) JPS57111466A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60260866A (en) * 1984-06-07 1985-12-24 Nec Corp Circuit connection collating device
US4620282A (en) * 1984-02-03 1986-10-28 Shelley Marlin C System and method for documenting and checking cable interconnections
CN108896862A (en) * 2018-06-29 2018-11-27 国网江苏省电力有限公司连云港供电分公司 A kind of the electronics evaluation system and method for electrician's wiring skill examination

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4620282A (en) * 1984-02-03 1986-10-28 Shelley Marlin C System and method for documenting and checking cable interconnections
JPS60260866A (en) * 1984-06-07 1985-12-24 Nec Corp Circuit connection collating device
CN108896862A (en) * 2018-06-29 2018-11-27 国网江苏省电力有限公司连云港供电分公司 A kind of the electronics evaluation system and method for electrician's wiring skill examination

Also Published As

Publication number Publication date
JPS6363068B2 (en) 1988-12-06

Similar Documents

Publication Publication Date Title
HK23292A (en) Process for operating a semiconductor memory with integrated parallel test capability and evaluation circuit for carrying out the process
JPS52119129A (en) System for automatically identifying defective memory part by testing electronic memory location in advance
MY105336A (en) Method and system for concurrent electronic component testing and lead verification
JPS57111466A (en) Automatic wiring continuity test system
JPS57182123A (en) Automatic tester
JPS56169292A (en) Storage device
ES2002189A6 (en) Train monitoring device
JPS5631146A (en) Automatic testing system for information processor
JPS5514716A (en) Remote test system for data transmission system
GB1151780A (en) Constant Current Pulse Circuit.
KR800001585B1 (en) Automatic handling apparatus of electronic cash register
JPS6413477A (en) Testing device for integrated circuit
JPS55135760A (en) Connector for wiring test unit
JPS6425400A (en) Circuit for testing access time
JPS5715296A (en) Testing system for storage device
JPS53118327A (en) Automatic test data generator
JPS55902A (en) Testing equipment for control system
JPS6473267A (en) Test data generation system for lsi
JPS56107400A (en) Memory test device
JPS52143708A (en) Signal line test system
JPS58211672A (en) Testing method for logic circuit
JPS57172263A (en) Large scale integrated circuit testing device
JPS5539074A (en) Cable inspecting device
JPS5717063A (en) Test circuit of microcomputer
JPS5764311A (en) Pcm system signal recorder and reproducer