JPS57172263A - Large scale integrated circuit testing device - Google Patents

Large scale integrated circuit testing device

Info

Publication number
JPS57172263A
JPS57172263A JP56050507A JP5050781A JPS57172263A JP S57172263 A JPS57172263 A JP S57172263A JP 56050507 A JP56050507 A JP 56050507A JP 5050781 A JP5050781 A JP 5050781A JP S57172263 A JPS57172263 A JP S57172263A
Authority
JP
Japan
Prior art keywords
test
result
tested
displayed
data memory
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP56050507A
Other languages
Japanese (ja)
Other versions
JPH0477271B2 (en
Inventor
Naoaki Narumi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nippon Telegraph and Telephone Corp
Original Assignee
Nippon Telegraph and Telephone Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Telegraph and Telephone Corp filed Critical Nippon Telegraph and Telephone Corp
Priority to JP56050507A priority Critical patent/JPS57172263A/en
Publication of JPS57172263A publication Critical patent/JPS57172263A/en
Publication of JPH0477271B2 publication Critical patent/JPH0477271B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits

Abstract

PURPOSE:To execute a test efficiently, by constituting so that contents of a test data memory for storing a result of the test, and a direct result of the test can be switched and displayed, and also the result obtained in the course of executing the test can be observed even after the test has been executed. CONSTITUTION:In case of the execution time display mode, an address signal is divided into a group X and a group Y, the divided signals are converted to analog signals by D/A converters 14, 15, and are applied to X and Y input terminals of a CRT indicator 16. On the other hand, a result of a test decided by comparing an output signal of a device to be tested, with an expected value signal by a comparator is applied to a Z input terminal, and the luminance is displayed. In case when it is used in the display mode after execution, a test data memory 12 becomes a read-out operation mode, the address signal applied to said device to be tested is used once again, the test data memory is scanned, and the written result is displayed on the indicator 16. In this way, detailed analysis of the cause of failure regarding the device to be tested can be executed at a high speed and efficiently.
JP56050507A 1981-04-06 1981-04-06 Large scale integrated circuit testing device Granted JPS57172263A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP56050507A JPS57172263A (en) 1981-04-06 1981-04-06 Large scale integrated circuit testing device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP56050507A JPS57172263A (en) 1981-04-06 1981-04-06 Large scale integrated circuit testing device

Publications (2)

Publication Number Publication Date
JPS57172263A true JPS57172263A (en) 1982-10-23
JPH0477271B2 JPH0477271B2 (en) 1992-12-07

Family

ID=12860865

Family Applications (1)

Application Number Title Priority Date Filing Date
JP56050507A Granted JPS57172263A (en) 1981-04-06 1981-04-06 Large scale integrated circuit testing device

Country Status (1)

Country Link
JP (1) JPS57172263A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6395366A (en) * 1986-10-09 1988-04-26 Nippon Telegr & Teleph Corp <Ntt> Test data memory

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5335446A (en) * 1976-09-13 1978-04-01 Tektronix Inc Logical analyzer
JPS5413231A (en) * 1977-07-01 1979-01-31 Takeda Riken Ind Co Ltd Memory tester

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5335446A (en) * 1976-09-13 1978-04-01 Tektronix Inc Logical analyzer
JPS5413231A (en) * 1977-07-01 1979-01-31 Takeda Riken Ind Co Ltd Memory tester

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6395366A (en) * 1986-10-09 1988-04-26 Nippon Telegr & Teleph Corp <Ntt> Test data memory

Also Published As

Publication number Publication date
JPH0477271B2 (en) 1992-12-07

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