JPS57108709A - Coordinate tracing system - Google Patents

Coordinate tracing system

Info

Publication number
JPS57108709A
JPS57108709A JP55186941A JP18694180A JPS57108709A JP S57108709 A JPS57108709 A JP S57108709A JP 55186941 A JP55186941 A JP 55186941A JP 18694180 A JP18694180 A JP 18694180A JP S57108709 A JPS57108709 A JP S57108709A
Authority
JP
Japan
Prior art keywords
circuit
probes
coordinate
coordinates
probe
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP55186941A
Other languages
English (en)
Japanese (ja)
Other versions
JPS6252828B2 (enrdf_load_stackoverflow
Inventor
Shigeru Soeno
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP55186941A priority Critical patent/JPS57108709A/ja
Publication of JPS57108709A publication Critical patent/JPS57108709A/ja
Publication of JPS6252828B2 publication Critical patent/JPS6252828B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B21/00—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
    • G01B21/02—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness
    • G01B21/04—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness by measuring coordinates of points

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Image Processing (AREA)
  • Image Analysis (AREA)
  • Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
  • Transmission And Conversion Of Sensor Element Output (AREA)
  • Tests Of Electronic Circuits (AREA)
JP55186941A 1980-12-26 1980-12-26 Coordinate tracing system Granted JPS57108709A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP55186941A JPS57108709A (en) 1980-12-26 1980-12-26 Coordinate tracing system

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP55186941A JPS57108709A (en) 1980-12-26 1980-12-26 Coordinate tracing system

Publications (2)

Publication Number Publication Date
JPS57108709A true JPS57108709A (en) 1982-07-06
JPS6252828B2 JPS6252828B2 (enrdf_load_stackoverflow) 1987-11-06

Family

ID=16197394

Family Applications (1)

Application Number Title Priority Date Filing Date
JP55186941A Granted JPS57108709A (en) 1980-12-26 1980-12-26 Coordinate tracing system

Country Status (1)

Country Link
JP (1) JPS57108709A (enrdf_load_stackoverflow)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0245200A (ja) * 1988-08-04 1990-02-15 Shigeru Murakoshi タフテッド基材マーキング装置
WO2012095430A1 (de) * 2011-01-12 2012-07-19 Carl Zeiss Industrielle Messtechnik Gmbh Verfahren und anordnung zum kalibrieren von messwertgebenden sensoren eines taktilen koordinatenmessgerätes

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4652699B2 (ja) * 2004-02-27 2011-03-16 日本電産リード株式会社 基板検査装置、位置調整方法

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0245200A (ja) * 1988-08-04 1990-02-15 Shigeru Murakoshi タフテッド基材マーキング装置
WO2012095430A1 (de) * 2011-01-12 2012-07-19 Carl Zeiss Industrielle Messtechnik Gmbh Verfahren und anordnung zum kalibrieren von messwertgebenden sensoren eines taktilen koordinatenmessgerätes

Also Published As

Publication number Publication date
JPS6252828B2 (enrdf_load_stackoverflow) 1987-11-06

Similar Documents

Publication Publication Date Title
GB2019011B (en) Testing apparatus for testing printed circuit board
SE7714010L (sv) Metanordning for kapacitiv bestemning av det inbordes leget hos tva relaytivt rorliga delar
DE3785978D1 (de) Geraet zum feststellen der raeumlichen anordnung eines elektronischen bauteils.
ATE103241T1 (de) Justierverfahren fuer den ort einer farbdichtemessung.
EP0400536A3 (en) Measuring device for a coordinate of a figure
EP0003038A3 (en) Method for overlay measurement using an electronic beam system as a measuring tool
JPS57108709A (en) Coordinate tracing system
DE3779623D1 (de) Vorrichtung zum pruefen von elektrischen leiterplatten.
DE3851675D1 (de) Integrierte Schaltung zum Auslesen eines optoelektronischen Bildsensors.
DE3069639D1 (en) Method and circuit for the partial correction in colour image reproduction
JPS5748166A (en) Character segment device
JPS5410765A (en) Measurement of any sharf
ATE35945T1 (de) Verfahren zum ausmessen einer bildflaeche.
JPS5410814A (en) Testre for electronic controller of automobile
GB1536123A (en) Position sensing apparatus
JPS5662322A (en) Electronic beam exposure method
JPS5427370A (en) Edge processing method in pattern test
GB2002908A (en) Automatic test equipment
JPS55143407A (en) Recorder for following wake
JPS5630609A (en) Polar coordinate recorder
JPS5342632A (en) Stability continous test method of bubble information
JPS5552223A (en) Exposure method in electronic beam exposure device
JPS5635274A (en) Information extracting system
JPS5696254A (en) Surface potentiometer
JPS5340866A (en) Method of inspecting printed circuit board