JPS57108263A - Producing device for thin film pattern - Google Patents

Producing device for thin film pattern

Info

Publication number
JPS57108263A
JPS57108263A JP18720380A JP18720380A JPS57108263A JP S57108263 A JPS57108263 A JP S57108263A JP 18720380 A JP18720380 A JP 18720380A JP 18720380 A JP18720380 A JP 18720380A JP S57108263 A JPS57108263 A JP S57108263A
Authority
JP
Japan
Prior art keywords
substrate
mask
electrodes
metallic
thin film
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP18720380A
Other languages
Japanese (ja)
Inventor
Hiroshi Sakai
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP18720380A priority Critical patent/JPS57108263A/en
Publication of JPS57108263A publication Critical patent/JPS57108263A/en
Pending legal-status Critical Current

Links

Classifications

    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/04Coating on selected surface areas, e.g. using masks
    • C23C14/042Coating on selected surface areas, e.g. using masks using masks

Abstract

PURPOSE:To control adhesive relation between a substrate surface and a mask so as to achieve adequate adhesion by providing plural pieces of metallic electrodes on the substrate side forming thin film patterns with the mask and detecting electrically the contact between the substrate and the mask. CONSTITUTION:An insulation film 22 is applied on the surface of a semiconductor substrate 21 disposed on a substrate stage. Metallic electrodes 23, 24 are beforehand deposited and formed via the film 22 on the peripheral part of the substrate 21. The electrodes 23, 24 and a detecting circuit 26 are connected by means of a switch S. A metallic mask 25 positioned, fixed and disposed opposite to the substrate 21 at a slight spacing is also connected to the circuit 26. The substrate 21 is brought closer to the mask 25, and at the moment when both adhere, the electrical conduction between the mask 25 and the electrodes 23, 24 on the substrate 21 side is generated, and this is detected with an ammeter M. At this moment, the adhering operation of the substrate 21 is stopped, whereby the adhesive relation is adequately controlled, and the damaging of the substrate 21 or the mask 25 is prevented.
JP18720380A 1980-12-25 1980-12-25 Producing device for thin film pattern Pending JPS57108263A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP18720380A JPS57108263A (en) 1980-12-25 1980-12-25 Producing device for thin film pattern

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP18720380A JPS57108263A (en) 1980-12-25 1980-12-25 Producing device for thin film pattern

Publications (1)

Publication Number Publication Date
JPS57108263A true JPS57108263A (en) 1982-07-06

Family

ID=16201890

Family Applications (1)

Application Number Title Priority Date Filing Date
JP18720380A Pending JPS57108263A (en) 1980-12-25 1980-12-25 Producing device for thin film pattern

Country Status (1)

Country Link
JP (1) JPS57108263A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1548147A1 (en) * 2003-12-26 2005-06-29 Seiko Epson Corporation Thin film formation method
CN106350767A (en) * 2015-07-14 2017-01-25 上海和辉光电有限公司 OLED substrate vacuum evaporation structure and OLED mask defect detection method

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1548147A1 (en) * 2003-12-26 2005-06-29 Seiko Epson Corporation Thin film formation method
CN106350767A (en) * 2015-07-14 2017-01-25 上海和辉光电有限公司 OLED substrate vacuum evaporation structure and OLED mask defect detection method
CN106350767B (en) * 2015-07-14 2019-02-15 上海和辉光电有限公司 Structure and OLED exposure mask defect inspection method is deposited in oled substrate

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