JPS5689042A - Gas detector - Google Patents
Gas detectorInfo
- Publication number
- JPS5689042A JPS5689042A JP16734179A JP16734179A JPS5689042A JP S5689042 A JPS5689042 A JP S5689042A JP 16734179 A JP16734179 A JP 16734179A JP 16734179 A JP16734179 A JP 16734179A JP S5689042 A JPS5689042 A JP S5689042A
- Authority
- JP
- Japan
- Prior art keywords
- reflection
- flat plate
- plate
- make
- reflection means
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000011248 coating agent Substances 0.000 abstract 2
- 238000000576 coating method Methods 0.000 abstract 2
- 230000003287 optical effect Effects 0.000 abstract 2
- 239000004033 plastic Substances 0.000 abstract 1
- 229920003023 plastic Polymers 0.000 abstract 1
- 230000005855 radiation Effects 0.000 abstract 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
- G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
- G01N21/3504—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light for analysing gases, e.g. multi-gas analysis
Abstract
PURPOSE:To make the gas detector inexpensive and make its optical axis alignment easy by constituting the infrared ray radiation system opposedly disposed by way of the space where the gas to be detected exists and the reflection means of the infrared ray detector provided with the reflection means with a flat plate. CONSTITUTION:A flat plate 1 as a reflection means is constituted essentially of a base plate 2 of a disc shape or the like made of plastics of, for example, 3-5m diameters. Reflection coating 4 is coated on the plate surface 3 in the base plate 2, and the flat plate 1 is so arranged as to be supported by a supporting member 5. In this way, the reflection means is formed into the flat plate coated with the reflection coating, by which said plate is made considerably inexpensive as compared to a retroreflector, and since it is not so difficult to make the diameter of the reflection surface one digit larger, the optical axis alignment is made extremely easy.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP16734179A JPS5689042A (en) | 1979-12-21 | 1979-12-21 | Gas detector |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP16734179A JPS5689042A (en) | 1979-12-21 | 1979-12-21 | Gas detector |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS5689042A true JPS5689042A (en) | 1981-07-20 |
Family
ID=15847926
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP16734179A Pending JPS5689042A (en) | 1979-12-21 | 1979-12-21 | Gas detector |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5689042A (en) |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0251045A (en) * | 1988-08-12 | 1990-02-21 | Mitsui Eng & Shipbuild Co Ltd | Method and apparatus for environment measurement |
WO2010055715A1 (en) * | 2008-11-14 | 2010-05-20 | 株式会社Ihi | Apparatus for determining concentration of gaseous component |
US8395771B2 (en) | 2008-11-14 | 2013-03-12 | Ihi Corporation | Apparatus and method for determining concentration of gaseous component |
JP2013245952A (en) * | 2012-05-23 | 2013-12-09 | Mitsubishi Heavy Ind Ltd | Concentration measuring device and denitrification device |
-
1979
- 1979-12-21 JP JP16734179A patent/JPS5689042A/en active Pending
Cited By (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0251045A (en) * | 1988-08-12 | 1990-02-21 | Mitsui Eng & Shipbuild Co Ltd | Method and apparatus for environment measurement |
WO2010055715A1 (en) * | 2008-11-14 | 2010-05-20 | 株式会社Ihi | Apparatus for determining concentration of gaseous component |
JP2010117303A (en) * | 2008-11-14 | 2010-05-27 | Ihi Corp | Apparatus for measuring concentration of gas component |
CN102216755A (en) * | 2008-11-14 | 2011-10-12 | 株式会社Ihi | Apparatus for determining concentration of gaseous component |
AU2009315123B2 (en) * | 2008-11-14 | 2012-08-09 | Ihi Corporation | Apparatus for determining concentration of gaseous component |
US8395771B2 (en) | 2008-11-14 | 2013-03-12 | Ihi Corporation | Apparatus and method for determining concentration of gaseous component |
KR101244397B1 (en) | 2008-11-14 | 2013-03-18 | 가부시키가이샤 아이에이치아이 | Apparatus for determining concentration of gaseous component |
JP2013245952A (en) * | 2012-05-23 | 2013-12-09 | Mitsubishi Heavy Ind Ltd | Concentration measuring device and denitrification device |
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