JPS5682441A - Ion concentration measuring method - Google Patents
Ion concentration measuring methodInfo
- Publication number
- JPS5682441A JPS5682441A JP16006379A JP16006379A JPS5682441A JP S5682441 A JPS5682441 A JP S5682441A JP 16006379 A JP16006379 A JP 16006379A JP 16006379 A JP16006379 A JP 16006379A JP S5682441 A JPS5682441 A JP S5682441A
- Authority
- JP
- Japan
- Prior art keywords
- ion
- conjugated
- electrodes
- selective
- responds
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
Abstract
PURPOSE: To analyze a sample of slight volume without using reference electrode by allowing ion selective electrodes responding to each of conjugated ion pairs if any to allow to contact with a same sample liquid and measuring the potential difference between both electrodes.
CONSTITUTION: In the measurement of conjugated ion pairs such as, H+ and OH-, in which the product of both ion densities are constant, the ion selective (IS)FETs, each of which is formed with a selective ion sensitive film I on the insulation layer L of the channel part C of a field effect transistor (FET) and is formed with the source S and drain D made into n type by respectively diffusing P into a p type silicon chip Si, are used. The ISFET-T1 which responds to one of the conjugated ions and the T2 which responds to the other are formed on a common silicon chip. The T1, T2 are constituted of gates G1, G2, a common drain D, and the sources S1, S2 respectively connected to source follower resistances R1, R2. In this way, no reference electrodes are required and the device is miniaturized.
COPYRIGHT: (C)1981,JPO&Japio
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP54160063A JPS6051661B2 (en) | 1979-12-10 | 1979-12-10 | Ion concentration measurement method |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP54160063A JPS6051661B2 (en) | 1979-12-10 | 1979-12-10 | Ion concentration measurement method |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5682441A true JPS5682441A (en) | 1981-07-06 |
JPS6051661B2 JPS6051661B2 (en) | 1985-11-15 |
Family
ID=15707089
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP54160063A Expired JPS6051661B2 (en) | 1979-12-10 | 1979-12-10 | Ion concentration measurement method |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS6051661B2 (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS63298151A (en) * | 1987-05-29 | 1988-12-05 | Shindengen Electric Mfg Co Ltd | Measuring circuit of ion sensor |
-
1979
- 1979-12-10 JP JP54160063A patent/JPS6051661B2/en not_active Expired
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS63298151A (en) * | 1987-05-29 | 1988-12-05 | Shindengen Electric Mfg Co Ltd | Measuring circuit of ion sensor |
Also Published As
Publication number | Publication date |
---|---|
JPS6051661B2 (en) | 1985-11-15 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
US4397714A (en) | System for measuring the concentration of chemical substances | |
SE7603229L (en) | CHEMICAL PAVABLE SENSOR | |
JPS5639454A (en) | Chemical suybstance detector by using chemical sensitive element with structure of insulated-gate field-effect transistor | |
JPS5323577A (en) | Complementary type insulated gate effect transistor | |
EP0307973A3 (en) | An isfet chip suitable to be used in an apparatus comprising a measuring circuit for selectively measuring ions in a liquid | |
DE3582757D1 (en) | GAS DETECTOR. | |
JPS5682441A (en) | Ion concentration measuring method | |
JPS5713764A (en) | Charge detector | |
JPS5384570A (en) | Field effect semiconductor device and its manufacture | |
JPS6476036A (en) | Thin film transistor panel | |
JPS54136275A (en) | Field effect transistor of isolation gate | |
JPS5626471A (en) | Mos type semiconductor device | |
JPS56105665A (en) | Semiconductor memory device | |
JPS5793247A (en) | Ion measuring device | |
JPS6476035A (en) | Manufacture of tft panel | |
JPS5682440A (en) | Ion concentration measuring device | |
JPS5693368A (en) | Mis transistor device | |
JPS57138177A (en) | Charge transfer device | |
JPS5626243A (en) | Flow cell | |
JPS5713765A (en) | Insulated gate type field effect transistor and manufacture thereof | |
JPS5582460A (en) | Negative resistance semiconductor element | |
JPS5513944A (en) | C-mos semiconductor device | |
JPS57176595A (en) | E-prom write-in circuit | |
JPS5338945A (en) | Multiplication circuit containing field-effect transistor | |
JPS57208176A (en) | Semiconductor negative resistance element |