JPS5681976A - Manufacture of pressure-sensitive diaphragm - Google Patents

Manufacture of pressure-sensitive diaphragm

Info

Publication number
JPS5681976A
JPS5681976A JP15845779A JP15845779A JPS5681976A JP S5681976 A JPS5681976 A JP S5681976A JP 15845779 A JP15845779 A JP 15845779A JP 15845779 A JP15845779 A JP 15845779A JP S5681976 A JPS5681976 A JP S5681976A
Authority
JP
Japan
Prior art keywords
layer
etching
gauge
film
polycrystalline
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP15845779A
Other languages
Japanese (ja)
Inventor
Yoshimichi Takizawa
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fuji Electric Co Ltd
Original Assignee
Fuji Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fuji Electric Co Ltd filed Critical Fuji Electric Co Ltd
Priority to JP15845779A priority Critical patent/JPS5681976A/en
Publication of JPS5681976A publication Critical patent/JPS5681976A/en
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00Semiconductor devices adapted for rectifying, amplifying, oscillating or switching, or capacitors or resistors with at least one potential-jump barrier or surface barrier, e.g. PN junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof  ; Multistep manufacturing processes therefor
    • H01L29/66Types of semiconductor device ; Multistep manufacturing processes therefor
    • H01L29/84Types of semiconductor device ; Multistep manufacturing processes therefor controllable by variation of applied mechanical force, e.g. of pressure

Abstract

PURPOSE:To obtain a diaphragm having preferable flatness by forming a strain gauge at the center of a monocrystalline Si substrate, growing a reinforcing polycrystalline Si layer on the entire surface including the strain gauge, and forming an etching stopping film on the gauge beforehand when removing the reinforcing layer on the gauge by etching. CONSTITUTION:A strain gauge 2 is diffused at the center on a monocrystalline Si substrate 1, and a film 5 of SiO2 or Si3N4 not etched with etchant in the step of etching later is covered on the entire surface including the gauge. Then, reinforcing polycrystalline Si layer 6 are accumulated thereon, the back surface of the substrate 1 is lapped, thereby forming the thickness in a thickness l adapted for a diaphragm. Thereafter, an etching mask 4 is formed on the periphery of the polycrystalline Si layer 6 on the surface, is etched, and the exposed region of the layer 6 is removed. When the film 5 is exposed due to the existence of the film 5 formed previously, the etching is automatically stopped, thereby obtaining desired flat diaphragm thereon.
JP15845779A 1979-12-06 1979-12-06 Manufacture of pressure-sensitive diaphragm Pending JPS5681976A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP15845779A JPS5681976A (en) 1979-12-06 1979-12-06 Manufacture of pressure-sensitive diaphragm

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP15845779A JPS5681976A (en) 1979-12-06 1979-12-06 Manufacture of pressure-sensitive diaphragm

Publications (1)

Publication Number Publication Date
JPS5681976A true JPS5681976A (en) 1981-07-04

Family

ID=15672159

Family Applications (1)

Application Number Title Priority Date Filing Date
JP15845779A Pending JPS5681976A (en) 1979-12-06 1979-12-06 Manufacture of pressure-sensitive diaphragm

Country Status (1)

Country Link
JP (1) JPS5681976A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20110000060A1 (en) * 2009-07-06 2011-01-06 KAIST (Korea Advanced Institute of Science and Technology) Flexible piezoelectric device and flexible capacitor manufactured by the same, and manufacturing method for flexible sensors

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20110000060A1 (en) * 2009-07-06 2011-01-06 KAIST (Korea Advanced Institute of Science and Technology) Flexible piezoelectric device and flexible capacitor manufactured by the same, and manufacturing method for flexible sensors
US8661634B2 (en) * 2009-07-06 2014-03-04 KAIST (Korea Advanced Institute of Science and Technology Method of manufacturing a flexible piezoelectric device

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