JPS5679240A - X-ray spectrometer - Google Patents

X-ray spectrometer

Info

Publication number
JPS5679240A
JPS5679240A JP15511879A JP15511879A JPS5679240A JP S5679240 A JPS5679240 A JP S5679240A JP 15511879 A JP15511879 A JP 15511879A JP 15511879 A JP15511879 A JP 15511879A JP S5679240 A JPS5679240 A JP S5679240A
Authority
JP
Japan
Prior art keywords
moving holder
guide
spectrometric
guide arm
crystal
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP15511879A
Other languages
English (en)
Japanese (ja)
Other versions
JPS6361615B2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html
Inventor
Kimio Okumura
Seigo Motome
Hideyuki Oi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
ERIONIKUSU KK
National Institute of Advanced Industrial Science and Technology AIST
Original Assignee
ERIONIKUSU KK
Agency of Industrial Science and Technology
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by ERIONIKUSU KK, Agency of Industrial Science and Technology filed Critical ERIONIKUSU KK
Priority to JP15511879A priority Critical patent/JPS5679240A/ja
Publication of JPS5679240A publication Critical patent/JPS5679240A/ja
Publication of JPS6361615B2 publication Critical patent/JPS6361615B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/207—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions

Landscapes

  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
JP15511879A 1979-11-30 1979-11-30 X-ray spectrometer Granted JPS5679240A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP15511879A JPS5679240A (en) 1979-11-30 1979-11-30 X-ray spectrometer

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP15511879A JPS5679240A (en) 1979-11-30 1979-11-30 X-ray spectrometer

Publications (2)

Publication Number Publication Date
JPS5679240A true JPS5679240A (en) 1981-06-29
JPS6361615B2 JPS6361615B2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) 1988-11-29

Family

ID=15598965

Family Applications (1)

Application Number Title Priority Date Filing Date
JP15511879A Granted JPS5679240A (en) 1979-11-30 1979-11-30 X-ray spectrometer

Country Status (1)

Country Link
JP (1) JPS5679240A (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59221646A (ja) * 1983-05-31 1984-12-13 Shimadzu Corp Ｘ線分光器
JPS60190844A (ja) * 1984-03-12 1985-09-28 Hitachi Ltd けい光ｘ線構造解析装置
CN114930135A (zh) * 2019-10-21 2022-08-19 易艾克弗斯有限公司 光谱仪

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59221646A (ja) * 1983-05-31 1984-12-13 Shimadzu Corp Ｘ線分光器
JPS60190844A (ja) * 1984-03-12 1985-09-28 Hitachi Ltd けい光ｘ線構造解析装置
CN114930135A (zh) * 2019-10-21 2022-08-19 易艾克弗斯有限公司 光谱仪
US20220349844A1 (en) * 2019-10-21 2022-11-03 Easyxafs, Llc Spectrometer
JP2022553015A (ja) * 2019-10-21 2022-12-21 イージーザフス，エルエルシー 分光器
US12235228B2 (en) * 2019-10-21 2025-02-25 Easyxafs, Llc Spectrometer

Also Published As

Publication number Publication date
JPS6361615B2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) 1988-11-29

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