JPS5670443A - Measuring device by using x ray - Google Patents
Measuring device by using x rayInfo
- Publication number
- JPS5670443A JPS5670443A JP14810979A JP14810979A JPS5670443A JP S5670443 A JPS5670443 A JP S5670443A JP 14810979 A JP14810979 A JP 14810979A JP 14810979 A JP14810979 A JP 14810979A JP S5670443 A JPS5670443 A JP S5670443A
- Authority
- JP
- Japan
- Prior art keywords
- rays
- reflected
- radiant
- ash
- energy
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- VTYYLEPIZMXCLO-UHFFFAOYSA-L Calcium carbonate Chemical compound [Ca+2].[O-]C([O-])=O VTYYLEPIZMXCLO-UHFFFAOYSA-L 0.000 abstract 4
- 238000010521 absorption reaction Methods 0.000 abstract 4
- 229910000019 calcium carbonate Inorganic materials 0.000 abstract 2
- 239000000470 constituent Substances 0.000 abstract 2
- 238000005259 measurement Methods 0.000 abstract 2
- 230000005855 radiation Effects 0.000 abstract 2
- 239000000126 substance Substances 0.000 abstract 2
- 239000005995 Aluminium silicate Substances 0.000 abstract 1
- OYPRJOBELJOOCE-UHFFFAOYSA-N Calcium Chemical compound [Ca] OYPRJOBELJOOCE-UHFFFAOYSA-N 0.000 abstract 1
- 235000012211 aluminium silicate Nutrition 0.000 abstract 1
- 229910052791 calcium Inorganic materials 0.000 abstract 1
- 239000011575 calcium Substances 0.000 abstract 1
- NLYAJNPCOHFWQQ-UHFFFAOYSA-N kaolin Chemical compound O.O.O=[Al]O[Si](=O)O[Si](=O)O[Al]=O NLYAJNPCOHFWQQ-UHFFFAOYSA-N 0.000 abstract 1
- -1 kaolin and talc Chemical compound 0.000 abstract 1
- 238000000034 method Methods 0.000 abstract 1
- 239000000454 talc Substances 0.000 abstract 1
- 229910052623 talc Inorganic materials 0.000 abstract 1
- 239000013077 target material Substances 0.000 abstract 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
- G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
- G01N23/083—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the radiation being X-rays
Landscapes
- Health & Medical Sciences (AREA)
- Toxicology (AREA)
- Physics & Mathematics (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP14810979A JPS5670443A (en) | 1979-11-15 | 1979-11-15 | Measuring device by using x ray |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP14810979A JPS5670443A (en) | 1979-11-15 | 1979-11-15 | Measuring device by using x ray |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5670443A true JPS5670443A (en) | 1981-06-12 |
| JPS6361614B2 JPS6361614B2 (OSRAM) | 1988-11-29 |
Family
ID=15445443
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP14810979A Granted JPS5670443A (en) | 1979-11-15 | 1979-11-15 | Measuring device by using x ray |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5670443A (OSRAM) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5746466U (OSRAM) * | 1980-08-28 | 1982-03-15 |
-
1979
- 1979-11-15 JP JP14810979A patent/JPS5670443A/ja active Granted
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5746466U (OSRAM) * | 1980-08-28 | 1982-03-15 |
Also Published As
| Publication number | Publication date |
|---|---|
| JPS6361614B2 (OSRAM) | 1988-11-29 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| US5659397A (en) | Method and apparatus for measuring total specular and diffuse optical properties from the surface of an object | |
| EP0144713A3 (en) | Device for optically measuring concentration of substances | |
| GB2112148A (en) | Microwave moisture sensor | |
| DE3279479D1 (en) | Apparatus for measuring thickness | |
| US3766383A (en) | Techniques and apparatus for calibrating the kilovoltage indicator on diagnostic x-ray generators | |
| JPS55119006A (en) | Displacement measuring instrument | |
| JPS5730916A (en) | Device for measuring surface temperature and emissivity | |
| JPS5670443A (en) | Measuring device by using x ray | |
| EP0206735A3 (en) | Coating weight and thickness gauges | |
| JPS54122176A (en) | White x-ray stress measuring apparatus | |
| JPS5594149A (en) | Reflecting type ash content meter | |
| JPS5582006A (en) | Measuring method for thickness | |
| GB1176209A (en) | A Device for X-Ray Radiometric Determination of the Concentration of Elements in Test Specimes | |
| Mizunuma | Measurement of X-Ray Effective Energy by Intensification of Lead Screen | |
| JPS5746146A (en) | Continuous measurement device for ash contained in paper | |
| JPS57172206A (en) | Correcting method for drift of plating thickness gauge | |
| JPS5595263A (en) | X-ray analyzer | |
| JPS5578233A (en) | Measuring unit for assembled constituent distribution | |
| Georgiev et al. | Method and device for measuring the thickness of solid fouling in pipes by means of radiation | |
| JPS5529726A (en) | Water content measuring method dependent upon infrared ray | |
| SU1176754A1 (ru) | Способ определени распределени радионуклидов по глубине при поверхностной активации изделий | |
| JPS54121089A (en) | Test device using radiant rays | |
| SU1073649A1 (ru) | Способ измерени концентрации наполнител в бумажном полотне | |
| SU461687A1 (ru) | Композици дл получени тканеэквивалентного материала | |
| SU1474461A1 (ru) | Способ измерени толщины |