JPS5578233A - Measuring unit for assembled constituent distribution - Google Patents

Measuring unit for assembled constituent distribution

Info

Publication number
JPS5578233A
JPS5578233A JP15155578A JP15155578A JPS5578233A JP S5578233 A JPS5578233 A JP S5578233A JP 15155578 A JP15155578 A JP 15155578A JP 15155578 A JP15155578 A JP 15155578A JP S5578233 A JPS5578233 A JP S5578233A
Authority
JP
Japan
Prior art keywords
sample
rays
test piece
lattice surface
detector
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP15155578A
Other languages
Japanese (ja)
Inventor
Tadahiro Abe
Michio Katayama
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
JFE Steel Corp
Original Assignee
Kawasaki Steel Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Kawasaki Steel Corp filed Critical Kawasaki Steel Corp
Priority to JP15155578A priority Critical patent/JPS5578233A/en
Publication of JPS5578233A publication Critical patent/JPS5578233A/en
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials

Landscapes

  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)

Abstract

PURPOSE:To measure the location of test piece and the crystal azimuth with strict correspondence, by providing the incident slit limiting the width and height of the emitted ray bundle with the bulb producing specific X-rays and step movement of test piece stand two-dimensionally through the provision of the intensity of diffraction due to lattice surface for the detector. CONSTITUTION:The incident slit 1 is placed on the emission path 2 by X-ray bulb, the photo detection slit 5 is placed on the reflection path 4 from the sample 3, and diffractive intensity is detected at the detector 6. When the lattice surface on the surface of measured sample 3 is determined, since the incident angle theta and the diffraction angle 2theta of specific X-rays are determined with the Braggs condition. The test piece 3 and the detector 6 can be set with the goniometer. The lattice surface in parallel with the surface of the sample 3 only can contribute to the diffraction of X-rays. Accordingly, the position of the test piece at fine area unit and the intensity of diffractive X-rays on the lattice surface are correspondend, then the sate of distribution on the lattice surface can be known. The sample stand placing the sample 3 is moved in step two-dimentionally to repeat measurement and the position of sample and the crystal azimuth can be measured in strict correspondence.
JP15155578A 1978-12-08 1978-12-08 Measuring unit for assembled constituent distribution Pending JPS5578233A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP15155578A JPS5578233A (en) 1978-12-08 1978-12-08 Measuring unit for assembled constituent distribution

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP15155578A JPS5578233A (en) 1978-12-08 1978-12-08 Measuring unit for assembled constituent distribution

Publications (1)

Publication Number Publication Date
JPS5578233A true JPS5578233A (en) 1980-06-12

Family

ID=15521073

Family Applications (1)

Application Number Title Priority Date Filing Date
JP15155578A Pending JPS5578233A (en) 1978-12-08 1978-12-08 Measuring unit for assembled constituent distribution

Country Status (1)

Country Link
JP (1) JPS5578233A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60144649A (en) * 1984-01-09 1985-07-31 Mitsubishi Heavy Ind Ltd X-ray diffraction method
JPH0464044A (en) * 1990-07-02 1992-02-28 Rigaku Corp Texture analyzer

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60144649A (en) * 1984-01-09 1985-07-31 Mitsubishi Heavy Ind Ltd X-ray diffraction method
JPH0464044A (en) * 1990-07-02 1992-02-28 Rigaku Corp Texture analyzer

Similar Documents

Publication Publication Date Title
Koc The quantum efficiency of the photo-electric effect in germanium for the 0.3–2 μ wavelength region
US2903590A (en) Nuclear radiation measuring instrument
JPS5578233A (en) Measuring unit for assembled constituent distribution
GB691847A (en) Improvements in or relating to x-ray apparatus
US3409774A (en) Method of determining the thickness of a coating on a metal base and method of calibrating the thickness gauge
JPS6441810A (en) Method for measuring applied film on metal thickness
JPS601576B2 (en) White X-ray stress measuring device
GB1176209A (en) A Device for X-Ray Radiometric Determination of the Concentration of Elements in Test Specimes
JPS5582006A (en) Measuring method for thickness
Reis et al. A New X‐Ray Diffraction Method for Studying Imperfections of Crystal Structure in Polycrystalline Specimens
JPS54685A (en) Simultaneously measurement of florescent x ray and diffracted x ray of minute area
JP2785848B2 (en) Measurement method for internal strain of crystal substrate
JPS5595263A (en) X-ray analyzer
JPS533884A (en) Stress measuring apparatus x-ray
GB1429865A (en)
Azaroff A new method for measuring integrated intensities photographically
Burns Studies in Tolerance of New England Forest Trees: A portable instrument for measuring solar radiation in forests. VI
JPS5912563Y2 (en) Fluorescent X-ray coating thickness analyzer
RU1692264C (en) Method of measuring velocity of relativistic charged particles
SU718769A1 (en) Three-crystal x-ray spectrometer
SU693487A1 (en) Geiger-muller counter with screen
SU461687A1 (en) Composition for obtaining tissue equivalent material
SU361483A1 (en) LIBRARY
JP2532867B2 (en) Thin film structure evaluation system
GB1027869A (en) Film dosimeter