JPS5578233A - Measuring unit for assembled constituent distribution - Google Patents

Measuring unit for assembled constituent distribution

Info

Publication number
JPS5578233A
JPS5578233A JP15155578A JP15155578A JPS5578233A JP S5578233 A JPS5578233 A JP S5578233A JP 15155578 A JP15155578 A JP 15155578A JP 15155578 A JP15155578 A JP 15155578A JP S5578233 A JPS5578233 A JP S5578233A
Authority
JP
Japan
Prior art keywords
sample
rays
test piece
lattice surface
detector
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP15155578A
Other languages
Japanese (ja)
Inventor
Tadahiro Abe
Michio Katayama
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
JFE Steel Corp
Original Assignee
Kawasaki Steel Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Kawasaki Steel Corp filed Critical Kawasaki Steel Corp
Priority to JP15155578A priority Critical patent/JPS5578233A/en
Publication of JPS5578233A publication Critical patent/JPS5578233A/en
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials

Landscapes

  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)

Abstract

PURPOSE:To measure the location of test piece and the crystal azimuth with strict correspondence, by providing the incident slit limiting the width and height of the emitted ray bundle with the bulb producing specific X-rays and step movement of test piece stand two-dimensionally through the provision of the intensity of diffraction due to lattice surface for the detector. CONSTITUTION:The incident slit 1 is placed on the emission path 2 by X-ray bulb, the photo detection slit 5 is placed on the reflection path 4 from the sample 3, and diffractive intensity is detected at the detector 6. When the lattice surface on the surface of measured sample 3 is determined, since the incident angle theta and the diffraction angle 2theta of specific X-rays are determined with the Braggs condition. The test piece 3 and the detector 6 can be set with the goniometer. The lattice surface in parallel with the surface of the sample 3 only can contribute to the diffraction of X-rays. Accordingly, the position of the test piece at fine area unit and the intensity of diffractive X-rays on the lattice surface are correspondend, then the sate of distribution on the lattice surface can be known. The sample stand placing the sample 3 is moved in step two-dimentionally to repeat measurement and the position of sample and the crystal azimuth can be measured in strict correspondence.
JP15155578A 1978-12-08 1978-12-08 Measuring unit for assembled constituent distribution Pending JPS5578233A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP15155578A JPS5578233A (en) 1978-12-08 1978-12-08 Measuring unit for assembled constituent distribution

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP15155578A JPS5578233A (en) 1978-12-08 1978-12-08 Measuring unit for assembled constituent distribution

Publications (1)

Publication Number Publication Date
JPS5578233A true JPS5578233A (en) 1980-06-12

Family

ID=15521073

Family Applications (1)

Application Number Title Priority Date Filing Date
JP15155578A Pending JPS5578233A (en) 1978-12-08 1978-12-08 Measuring unit for assembled constituent distribution

Country Status (1)

Country Link
JP (1) JPS5578233A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60144649A (en) * 1984-01-09 1985-07-31 Mitsubishi Heavy Ind Ltd X-ray diffraction method
JPH0464044A (en) * 1990-07-02 1992-02-28 Rigaku Corp Texture analyzer

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60144649A (en) * 1984-01-09 1985-07-31 Mitsubishi Heavy Ind Ltd X-ray diffraction method
JPH0464044A (en) * 1990-07-02 1992-02-28 Rigaku Corp Texture analyzer

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