JPS5669828A - Checking method for x-ray exposure condition - Google Patents
Checking method for x-ray exposure conditionInfo
- Publication number
- JPS5669828A JPS5669828A JP14525879A JP14525879A JPS5669828A JP S5669828 A JPS5669828 A JP S5669828A JP 14525879 A JP14525879 A JP 14525879A JP 14525879 A JP14525879 A JP 14525879A JP S5669828 A JPS5669828 A JP S5669828A
- Authority
- JP
- Japan
- Prior art keywords
- ray
- membrane
- exposure condition
- different
- exposure
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F1/00—Originals for photomechanical production of textured or patterned surfaces, e.g., masks, photo-masks, reticles; Mask blanks or pellicles therefor; Containers specially adapted therefor; Preparation thereof
- G03F1/22—Masks or mask blanks for imaging by radiation of 100nm or shorter wavelength, e.g. X-ray masks, extreme ultraviolet [EUV] masks; Preparation thereof
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70008—Production of exposure light, i.e. light sources
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Preparing Plates And Mask In Photomechanical Process (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP14525879A JPS5669828A (en) | 1979-11-09 | 1979-11-09 | Checking method for x-ray exposure condition |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP14525879A JPS5669828A (en) | 1979-11-09 | 1979-11-09 | Checking method for x-ray exposure condition |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5669828A true JPS5669828A (en) | 1981-06-11 |
JPS625334B2 JPS625334B2 (enrdf_load_stackoverflow) | 1987-02-04 |
Family
ID=15380967
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP14525879A Granted JPS5669828A (en) | 1979-11-09 | 1979-11-09 | Checking method for x-ray exposure condition |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5669828A (enrdf_load_stackoverflow) |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS53107276A (en) * | 1977-03-01 | 1978-09-19 | Fujitsu Ltd | Mask for x-ray exposure |
-
1979
- 1979-11-09 JP JP14525879A patent/JPS5669828A/ja active Granted
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS53107276A (en) * | 1977-03-01 | 1978-09-19 | Fujitsu Ltd | Mask for x-ray exposure |
Also Published As
Publication number | Publication date |
---|---|
JPS625334B2 (enrdf_load_stackoverflow) | 1987-02-04 |
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