JPS5664650A - Fault inspection system - Google Patents
Fault inspection systemInfo
- Publication number
- JPS5664650A JPS5664650A JP14076579A JP14076579A JPS5664650A JP S5664650 A JPS5664650 A JP S5664650A JP 14076579 A JP14076579 A JP 14076579A JP 14076579 A JP14076579 A JP 14076579A JP S5664650 A JPS5664650 A JP S5664650A
- Authority
- JP
- Japan
- Prior art keywords
- signal
- output
- circuit
- signals
- nand
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
Landscapes
- Engineering & Computer Science (AREA)
- Textile Engineering (AREA)
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
Abstract
PURPOSE:To enable to detect all faults on the object to be inspected with high accuracy by a method wherein a multilevel fixed level binary circuit is added by a floating level binary system circuit. CONSTITUTION:In case faults exist on an object to be inspected, an image pickup signal from an image pickup system 7 becomes a signal a in an amplifier 9, enters a delay unit 13 and is output from the unit 13 as an b signal. An attenuator 15 outputs a C signal and an attenuator 17 outputs a d signal. On this account, a comparator 19, a binary signal f is obtained. The NAND conditional signals j, k of the aforementioned binary signals e, f and the output signals h, i of flipflop 21, 23 are as shown in (H), and (I) and further, the output j of a NAND circuit 25 contains two pulses corresponding to faulty signals S5, S7 and the output k of a NAND circuit 27 contains two pulses corresponding to faulty signals S5, S6. Whereas, faulty signals are not detected in a multilevel fixed level system inspection circuit 31 and the NAND conditional signal of the output m of a NOT circuit 33 and the output j, k of NAND circuits 25, 26 is an n. In this way, discrimination of fault is performed.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP14076579A JPS5664650A (en) | 1979-10-31 | 1979-10-31 | Fault inspection system |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP14076579A JPS5664650A (en) | 1979-10-31 | 1979-10-31 | Fault inspection system |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS5664650A true JPS5664650A (en) | 1981-06-01 |
Family
ID=15276215
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP14076579A Pending JPS5664650A (en) | 1979-10-31 | 1979-10-31 | Fault inspection system |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5664650A (en) |
-
1979
- 1979-10-31 JP JP14076579A patent/JPS5664650A/en active Pending
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