JPS5641665A - Sample-introducing device for mass spectrometer - Google Patents

Sample-introducing device for mass spectrometer

Info

Publication number
JPS5641665A
JPS5641665A JP11619779A JP11619779A JPS5641665A JP S5641665 A JPS5641665 A JP S5641665A JP 11619779 A JP11619779 A JP 11619779A JP 11619779 A JP11619779 A JP 11619779A JP S5641665 A JPS5641665 A JP S5641665A
Authority
JP
Japan
Prior art keywords
filament
current
probe
emitter
sample
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP11619779A
Other languages
Japanese (ja)
Other versions
JPS5829574B2 (en
Inventor
Sadao Takahashi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP54116197A priority Critical patent/JPS5829574B2/en
Publication of JPS5641665A publication Critical patent/JPS5641665A/en
Publication of JPS5829574B2 publication Critical patent/JPS5829574B2/en
Expired legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
    • H01J49/0468—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components with means for heating or cooling the sample
    • H01J49/049—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components with means for heating or cooling the sample with means for applying heat to desorb the sample; Evaporation

Abstract

PURPOSE:To prevent any disconnection of a filament for an emitter to which a sample is attached by providing the measures of controlling the current of the emitter, and thereby automatically intercepting the emitter current when a probe is drawn from an ion-source room. CONSTITUTION:A conductive strut 9 at the end of a probe 4 is provided with a filament 3. In analysing, an emitter 2 with a sample attached to that is mounted on the conductive strut 9. In addition to that, a probe 4 is provided with a groove 8. If the contact segment of a micro-switch 6 is interposed in the groove 8, a current- controlling circuit 14 functions by means of an inverter 12, counter 11 and a D/A converter 13, in that order, to generate a current which heats the filament 3. Consequently, when the probe 4 is drawn from the ion-source room 1 current is not supplied to the filament 3, and only when the probe is inserted in the ion-source room 1 current is supplied to the filament 3. Therefore any disconnection of the filament 3 can be obviated and the life of the filament 3 can be lengthened.
JP54116197A 1979-09-12 1979-09-12 Mass spectrometer sample introduction device Expired JPS5829574B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP54116197A JPS5829574B2 (en) 1979-09-12 1979-09-12 Mass spectrometer sample introduction device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP54116197A JPS5829574B2 (en) 1979-09-12 1979-09-12 Mass spectrometer sample introduction device

Publications (2)

Publication Number Publication Date
JPS5641665A true JPS5641665A (en) 1981-04-18
JPS5829574B2 JPS5829574B2 (en) 1983-06-23

Family

ID=14681233

Family Applications (1)

Application Number Title Priority Date Filing Date
JP54116197A Expired JPS5829574B2 (en) 1979-09-12 1979-09-12 Mass spectrometer sample introduction device

Country Status (1)

Country Link
JP (1) JPS5829574B2 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2020085602A (en) * 2018-11-21 2020-06-04 日本電子株式会社 Mass analysis system and emitter current control method

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0462283U (en) * 1990-10-09 1992-05-28

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2020085602A (en) * 2018-11-21 2020-06-04 日本電子株式会社 Mass analysis system and emitter current control method
US11397168B2 (en) 2018-11-21 2022-07-26 Jeol Ltd. Mass spectrometry system and emitter current control method

Also Published As

Publication number Publication date
JPS5829574B2 (en) 1983-06-23

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