JPS5633851A - Semiconductor pellet and method for removing burr - Google Patents
Semiconductor pellet and method for removing burrInfo
- Publication number
- JPS5633851A JPS5633851A JP10914679A JP10914679A JPS5633851A JP S5633851 A JPS5633851 A JP S5633851A JP 10914679 A JP10914679 A JP 10914679A JP 10914679 A JP10914679 A JP 10914679A JP S5633851 A JPS5633851 A JP S5633851A
- Authority
- JP
- Japan
- Prior art keywords
- pellets
- sieve
- wafer
- cracking
- burr
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/70—Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
- H01L21/77—Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate
- H01L21/78—Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate with subsequent division of the substrate into plural individual devices
Abstract
PURPOSE:To remove the burr occurring on the whole sides of the pellets at cracking a wafer by vibrating a sieve wherein plural pellets are put in the sieve. CONSTITUTION:A semiconductor wafer is diced as far as the midway of the direction of its thickness. Then, many pellets 3 obtained by cracking the wafer are put in a plane sieve 8 and the sieve 8 is vibrated. With the vibration repeated for the scores of minutes, the cracked parts of the pellets 3 on the sides of the semiconductor pellets which occurred by cracking the wafer become obtuse angle shape and the burr which have a bad effect on characteristics will be eliminated.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP10914679A JPS5633851A (en) | 1979-08-29 | 1979-08-29 | Semiconductor pellet and method for removing burr |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP10914679A JPS5633851A (en) | 1979-08-29 | 1979-08-29 | Semiconductor pellet and method for removing burr |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS5633851A true JPS5633851A (en) | 1981-04-04 |
Family
ID=14502766
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP10914679A Pending JPS5633851A (en) | 1979-08-29 | 1979-08-29 | Semiconductor pellet and method for removing burr |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5633851A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5462900A (en) * | 1993-03-15 | 1995-10-31 | Rohm Co., Ltd. | Method of manufacturing semiconductor elements without burrs |
-
1979
- 1979-08-29 JP JP10914679A patent/JPS5633851A/en active Pending
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5462900A (en) * | 1993-03-15 | 1995-10-31 | Rohm Co., Ltd. | Method of manufacturing semiconductor elements without burrs |
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