JPS5631147A - Diagnosing system for information processor - Google Patents

Diagnosing system for information processor

Info

Publication number
JPS5631147A
JPS5631147A JP10739779A JP10739779A JPS5631147A JP S5631147 A JPS5631147 A JP S5631147A JP 10739779 A JP10739779 A JP 10739779A JP 10739779 A JP10739779 A JP 10739779A JP S5631147 A JPS5631147 A JP S5631147A
Authority
JP
Japan
Prior art keywords
circuit
circuits
diagnosis
random number
single unit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP10739779A
Other languages
Japanese (ja)
Inventor
Katsuhei Oshio
Shigehito Mori
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Nippon Telegraph and Telephone Corp
Original Assignee
Fujitsu Ltd
Nippon Telegraph and Telephone Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd, Nippon Telegraph and Telephone Corp filed Critical Fujitsu Ltd
Priority to JP10739779A priority Critical patent/JPS5631147A/en
Publication of JPS5631147A publication Critical patent/JPS5631147A/en
Pending legal-status Critical Current

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  • Test And Diagnosis Of Digital Computers (AREA)

Abstract

PURPOSE: To ensure a delicate diagnosis in an easy way not only for the single unit of the internal circuit but for the information processor, by using in switching the latch circuit which is formed at the front stage inside the single unit of the circuit for a pseudo random number generating circuit during the diagnosis.
CONSTITUTION: The chip 4-2, one of several internal circuits, contains the central circuit 400 to be tested plus the latch circuits 41W43 and gate circuit installed at the front stage and the information compressing circuit 410 at the rear stage each. The input information I1WI3 are supplied to the latch circuits 41W43 via the gate circuit and by the mode switch signal 401 and at the time of the normal execution. When the diagnosis input is set, the AND circuits 412, 422 and 432 are opened by the mode switch signal 402. Then a shift register type pseudo random number generating circuit having the linear feedback is formed with the circuits 41W43 plus the exclusive logic sum circuit 44, and thus the diagnosis input is applied. The clock which is supplied to the pseudo random number generating circuit is applied in an asynchronous way via the clock output control signal 404 and AND circuit 404 each. As a result, not only the single unit of each circuit but a group of the circuit or the units can be diagnosed.
COPYRIGHT: (C)1981,JPO&Japio
JP10739779A 1979-08-23 1979-08-23 Diagnosing system for information processor Pending JPS5631147A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP10739779A JPS5631147A (en) 1979-08-23 1979-08-23 Diagnosing system for information processor

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP10739779A JPS5631147A (en) 1979-08-23 1979-08-23 Diagnosing system for information processor

Publications (1)

Publication Number Publication Date
JPS5631147A true JPS5631147A (en) 1981-03-28

Family

ID=14458100

Family Applications (1)

Application Number Title Priority Date Filing Date
JP10739779A Pending JPS5631147A (en) 1979-08-23 1979-08-23 Diagnosing system for information processor

Country Status (1)

Country Link
JP (1) JPS5631147A (en)

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