JPS5629365A - Semiconductor device and manufacture thereof - Google Patents

Semiconductor device and manufacture thereof

Info

Publication number
JPS5629365A
JPS5629365A JP10403679A JP10403679A JPS5629365A JP S5629365 A JPS5629365 A JP S5629365A JP 10403679 A JP10403679 A JP 10403679A JP 10403679 A JP10403679 A JP 10403679A JP S5629365 A JPS5629365 A JP S5629365A
Authority
JP
Japan
Prior art keywords
layer
auge
electrode
thickness
gaas
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP10403679A
Other languages
Japanese (ja)
Inventor
Haruo Yamagishi
Yasunori Fujii
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Tokyo Shibaura Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp, Tokyo Shibaura Electric Co Ltd filed Critical Toshiba Corp
Priority to JP10403679A priority Critical patent/JPS5629365A/en
Publication of JPS5629365A publication Critical patent/JPS5629365A/en
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00Semiconductor devices adapted for rectifying, amplifying, oscillating or switching, or capacitors or resistors with at least one potential-jump barrier or surface barrier, e.g. PN junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof  ; Multistep manufacturing processes therefor
    • H01L29/40Electrodes ; Multistep manufacturing processes therefor
    • H01L29/43Electrodes ; Multistep manufacturing processes therefor characterised by the materials of which they are formed
    • H01L29/45Ohmic electrodes
    • H01L29/452Ohmic electrodes on AIII-BV compounds

Abstract

PURPOSE:To decrease the dispersion in resistance of Hall sensor elements and unbalanced voltages by overlapping a metal layer whose main component is Au, a Ta layer, and an Au layer on a GaAs substrate, and specifying the thicknesses of said layers. CONSTITUTION:SiO2 4 is deposited on an epitaxial layer 3.1 having the carrier concentration of about 5X10<15>cm<-3> on a GaAs insulating substrate 3 of (100) face. A hole is perforated in the SiO2 film 4, and AuGe 5, Ta 6, and Au 7 are consecutively deposited. In this case, the thicknesses of said layers are controlled so that the thickness of AuGe is 0.1-0.3mum, the thickness of Ta is 0.1-0.3mum, and the thickness of Au is 1-2mum. Then, each layer except the electrode 2 is etched out by the photoetching method. Furthermore, a Hall bar 1 and the electrode 2 are covered by a resist, the SiO2 film 4 is etched out, and the epitaxial layer 3.1 and the substrate 3 are etched. Finally, the heat treatment is performed in H2, and uniform ohmic contact is formed between AuGe and GaAs of the electrode 2. In this constitution of the Hall sensor, the dispersion in the unbalanced voltages and the resistance of the elements are very small, and the yield rate is excellent.
JP10403679A 1979-08-17 1979-08-17 Semiconductor device and manufacture thereof Pending JPS5629365A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP10403679A JPS5629365A (en) 1979-08-17 1979-08-17 Semiconductor device and manufacture thereof

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP10403679A JPS5629365A (en) 1979-08-17 1979-08-17 Semiconductor device and manufacture thereof

Publications (1)

Publication Number Publication Date
JPS5629365A true JPS5629365A (en) 1981-03-24

Family

ID=14369993

Family Applications (1)

Application Number Title Priority Date Filing Date
JP10403679A Pending JPS5629365A (en) 1979-08-17 1979-08-17 Semiconductor device and manufacture thereof

Country Status (1)

Country Link
JP (1) JPS5629365A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101060413B1 (en) * 2004-04-29 2011-08-29 엘지디스플레이 주식회사 Image display device and manufacturing method thereof
CN104393167A (en) * 2014-09-25 2015-03-04 中国科学院物理研究所 Hall strip micro device

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101060413B1 (en) * 2004-04-29 2011-08-29 엘지디스플레이 주식회사 Image display device and manufacturing method thereof
CN104393167A (en) * 2014-09-25 2015-03-04 中国科学院物理研究所 Hall strip micro device

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