JPS5626208A - Malformation measuring method - Google Patents
Malformation measuring methodInfo
- Publication number
- JPS5626208A JPS5626208A JP10247379A JP10247379A JPS5626208A JP S5626208 A JPS5626208 A JP S5626208A JP 10247379 A JP10247379 A JP 10247379A JP 10247379 A JP10247379 A JP 10247379A JP S5626208 A JPS5626208 A JP S5626208A
- Authority
- JP
- Japan
- Prior art keywords
- malformation
- speckle pattern
- given
- photoelectric conversion
- extent
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Length Measuring Devices By Optical Means (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP10247379A JPS5952963B2 (ja) | 1979-08-09 | 1979-08-09 | 変形の測定方法 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP10247379A JPS5952963B2 (ja) | 1979-08-09 | 1979-08-09 | 変形の測定方法 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5626208A true JPS5626208A (en) | 1981-03-13 |
JPS5952963B2 JPS5952963B2 (ja) | 1984-12-22 |
Family
ID=14328413
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP10247379A Expired JPS5952963B2 (ja) | 1979-08-09 | 1979-08-09 | 変形の測定方法 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5952963B2 (ja) |
Cited By (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH01320411A (ja) * | 1988-06-22 | 1989-12-26 | Hamamatsu Photonics Kk | 変形の測定方法 |
JPH02297006A (ja) * | 1989-05-11 | 1990-12-07 | Keyence Corp | 物体の変位測定方法及び装置 |
JPH047939U (ja) * | 1990-05-10 | 1992-01-24 | ||
JPH0431632U (ja) * | 1990-07-12 | 1992-03-13 | ||
US6642506B1 (en) | 2000-06-01 | 2003-11-04 | Mitutoyo Corporation | Speckle-image-based optical position transducer having improved mounting and directional sensitivities |
US6873422B2 (en) | 2000-12-08 | 2005-03-29 | Mitutoyo Corporation | Systems and methods for high-accuracy displacement determination in a correlation based position transducer |
JP2007176127A (ja) * | 2005-12-28 | 2007-07-12 | Komatsu Zenoah Co | 枝葉木粉砕機 |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP7346489B2 (ja) | 2021-04-27 | 2023-09-19 | キヤノン株式会社 | 変位計、コンピュータプログラム、製造システム、及び物品の製造方法 |
-
1979
- 1979-08-09 JP JP10247379A patent/JPS5952963B2/ja not_active Expired
Cited By (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH01320411A (ja) * | 1988-06-22 | 1989-12-26 | Hamamatsu Photonics Kk | 変形の測定方法 |
EP0347911A2 (en) * | 1988-06-22 | 1989-12-27 | Hamamatsu Photonics K.K. | Deformation measuring method and device using photosensitive element array |
JPH02297006A (ja) * | 1989-05-11 | 1990-12-07 | Keyence Corp | 物体の変位測定方法及び装置 |
JPH047939U (ja) * | 1990-05-10 | 1992-01-24 | ||
JPH0431632U (ja) * | 1990-07-12 | 1992-03-13 | ||
US6642506B1 (en) | 2000-06-01 | 2003-11-04 | Mitutoyo Corporation | Speckle-image-based optical position transducer having improved mounting and directional sensitivities |
US6873422B2 (en) | 2000-12-08 | 2005-03-29 | Mitutoyo Corporation | Systems and methods for high-accuracy displacement determination in a correlation based position transducer |
JP2007176127A (ja) * | 2005-12-28 | 2007-07-12 | Komatsu Zenoah Co | 枝葉木粉砕機 |
Also Published As
Publication number | Publication date |
---|---|
JPS5952963B2 (ja) | 1984-12-22 |
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