JPS56156986A - Semiconductor storage device - Google Patents

Semiconductor storage device

Info

Publication number
JPS56156986A
JPS56156986A JP5848880A JP5848880A JPS56156986A JP S56156986 A JPS56156986 A JP S56156986A JP 5848880 A JP5848880 A JP 5848880A JP 5848880 A JP5848880 A JP 5848880A JP S56156986 A JPS56156986 A JP S56156986A
Authority
JP
Japan
Prior art keywords
clear
write
clearing
spite
fault
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP5848880A
Other languages
English (en)
Japanese (ja)
Other versions
JPS6135629B2 (enExample
Inventor
Hidetsune Kurokawa
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp, Nippon Electric Co Ltd filed Critical NEC Corp
Priority to JP5848880A priority Critical patent/JPS56156986A/ja
Publication of JPS56156986A publication Critical patent/JPS56156986A/ja
Publication of JPS6135629B2 publication Critical patent/JPS6135629B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing

Landscapes

  • Static Random-Access Memory (AREA)
  • Techniques For Improving Reliability Of Storages (AREA)
JP5848880A 1980-04-30 1980-04-30 Semiconductor storage device Granted JPS56156986A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP5848880A JPS56156986A (en) 1980-04-30 1980-04-30 Semiconductor storage device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP5848880A JPS56156986A (en) 1980-04-30 1980-04-30 Semiconductor storage device

Publications (2)

Publication Number Publication Date
JPS56156986A true JPS56156986A (en) 1981-12-03
JPS6135629B2 JPS6135629B2 (enExample) 1986-08-14

Family

ID=13085809

Family Applications (1)

Application Number Title Priority Date Filing Date
JP5848880A Granted JPS56156986A (en) 1980-04-30 1980-04-30 Semiconductor storage device

Country Status (1)

Country Link
JP (1) JPS56156986A (enExample)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5958690A (ja) * 1982-09-28 1984-04-04 Fujitsu Ltd Ｉｃメモリ
JPS63149899A (ja) * 1986-12-15 1988-06-22 Toshiba Corp 半導体メモリ
JPH0229987A (ja) * 1988-07-19 1990-01-31 Nec Corp 半導体メモリ回路

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS50105031A (enExample) * 1974-01-23 1975-08-19

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS50105031A (enExample) * 1974-01-23 1975-08-19

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5958690A (ja) * 1982-09-28 1984-04-04 Fujitsu Ltd Ｉｃメモリ
JPS63149899A (ja) * 1986-12-15 1988-06-22 Toshiba Corp 半導体メモリ
JPH0229987A (ja) * 1988-07-19 1990-01-31 Nec Corp 半導体メモリ回路

Also Published As

Publication number Publication date
JPS6135629B2 (enExample) 1986-08-14

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