JPS5615541A - Method of attaching sample to emitter - Google Patents

Method of attaching sample to emitter

Info

Publication number
JPS5615541A
JPS5615541A JP9019279A JP9019279A JPS5615541A JP S5615541 A JPS5615541 A JP S5615541A JP 9019279 A JP9019279 A JP 9019279A JP 9019279 A JP9019279 A JP 9019279A JP S5615541 A JPS5615541 A JP S5615541A
Authority
JP
Japan
Prior art keywords
emitter
microneedles
sample
needles
sample solution
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP9019279A
Other languages
English (en)
Other versions
JPS5829572B2 (ja
Inventor
Masahiko Kuwata
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Jeol Ltd
Original Assignee
Jeol Ltd
Nihon Denshi KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Jeol Ltd, Nihon Denshi KK filed Critical Jeol Ltd
Priority to JP54090192A priority Critical patent/JPS5829572B2/ja
Publication of JPS5615541A publication Critical patent/JPS5615541A/ja
Publication of JPS5829572B2 publication Critical patent/JPS5829572B2/ja
Expired legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
    • H01J49/0409—Sample holders or containers
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
    • H01J49/0468—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components with means for heating or cooling the sample

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)
JP54090192A 1979-07-16 1979-07-16 エミツタ−への試料付着方法 Expired JPS5829572B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP54090192A JPS5829572B2 (ja) 1979-07-16 1979-07-16 エミツタ−への試料付着方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP54090192A JPS5829572B2 (ja) 1979-07-16 1979-07-16 エミツタ−への試料付着方法

Publications (2)

Publication Number Publication Date
JPS5615541A true JPS5615541A (en) 1981-02-14
JPS5829572B2 JPS5829572B2 (ja) 1983-06-23

Family

ID=13991610

Family Applications (1)

Application Number Title Priority Date Filing Date
JP54090192A Expired JPS5829572B2 (ja) 1979-07-16 1979-07-16 エミツタ−への試料付着方法

Country Status (1)

Country Link
JP (1) JPS5829572B2 (ja)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2009092649A (ja) * 2007-09-19 2009-04-30 Hitachi Ltd 微小試料加熱プローブおよびその製造方法、ならびに微小試料加熱プローブを用いた分析装置および分析方法
EP2040282A3 (en) * 2007-09-19 2010-09-29 Hitachi Ltd. Micro sample heating probe and method of producing the same, and analyzer using the micro sample heating probe

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2009092649A (ja) * 2007-09-19 2009-04-30 Hitachi Ltd 微小試料加熱プローブおよびその製造方法、ならびに微小試料加熱プローブを用いた分析装置および分析方法
EP2040282A3 (en) * 2007-09-19 2010-09-29 Hitachi Ltd. Micro sample heating probe and method of producing the same, and analyzer using the micro sample heating probe

Also Published As

Publication number Publication date
JPS5829572B2 (ja) 1983-06-23

Similar Documents

Publication Publication Date Title
JPS5330865A (en) Electron microscope provided with sample irradiating electron beam quantity measuring unit
JPS5615541A (en) Method of attaching sample to emitter
SE8500419L (sv) Forfarande for framstellning av elektrod
JPS5510472A (en) Production of activated carbon fiber
EP0310739B1 (de) Vorrichtung zum Ziehen von Einkristallen
JPS5689435A (en) Method of correcting tilt of electrode for electric machining and device for the same
GB742063A (en) Improvements in and relating to the manufacture of tungsten filaments
US4101278A (en) Ionization detector utilizing tritiated scandium with an acceptable tritium emanation rate at high temperature
CN104966655B (zh) 一种环形碳纤维阴极及其制备方法
JPS54134964A (en) Manufacture of carbide field emitter
JPS5661738A (en) Test method for electron gun
JPS5665928A (en) One shot uniform heating method for surface of stepped shaft
GB915882A (en) Improvements in or relating to processes for the production of mono-crystalline semi-conductor rods
JPS58822B2 (ja) Ｆｄ用エミツタ活性化装置
Krtil et al. Experience with the neodymium method for determination of nuclear fuel burn up
JPS5549836A (en) Sealing method for luminous tube
SU1009554A1 (ru) Способ изготовлени инструмента из быстрорежущей стали
DE2234295A1 (de) Vorrichtung und verfahren zum trocknen und entwickeln von chromatogrammen
Wroe DETAILS OF THE OXIDE CATHODES USED IN THE AGS DUOPLASMATRON SOURCE
JPS54131372A (en) Method of making bulb having electrode supporter made of high melting point glass
JPS5676377A (en) Rotating tool attaching device with centering apparatus
Brugiere et al. Study of the Point Defects Produced in Aluminum by Quenching and Electron Irradiation
Chappell NBS High-Tech Ceramics Program Geared to Needs of Industry
JPS5516325A (en) Method and apparatus for producing emitter
Chalant et al. A Tentative Rationale of the Threshold Behaviour Obtained from Strain Distribution at the Crack Tip