JPS56151367A - Non-contact testing point detection of automatic tester - Google Patents

Non-contact testing point detection of automatic tester

Info

Publication number
JPS56151367A
JPS56151367A JP4610281A JP4610281A JPS56151367A JP S56151367 A JPS56151367 A JP S56151367A JP 4610281 A JP4610281 A JP 4610281A JP 4610281 A JP4610281 A JP 4610281A JP S56151367 A JPS56151367 A JP S56151367A
Authority
JP
Japan
Prior art keywords
point detection
testing point
automatic tester
contact testing
contact
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP4610281A
Other languages
English (en)
Inventor
Jiei Ratsuseru Robaato
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Bull HN Information Systems Italia SpA
Original Assignee
Honeywell Information Systems Italia SpA
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Honeywell Information Systems Italia SpA filed Critical Honeywell Information Systems Italia SpA
Publication of JPS56151367A publication Critical patent/JPS56151367A/ja
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/2806—Apparatus therefor, e.g. test stations, drivers, analysers, conveyors
JP4610281A 1980-03-28 1981-03-28 Non-contact testing point detection of automatic tester Pending JPS56151367A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US06/134,809 US4342958A (en) 1980-03-28 1980-03-28 Automatic test equipment test probe contact isolation detection method

Publications (1)

Publication Number Publication Date
JPS56151367A true JPS56151367A (en) 1981-11-24

Family

ID=22465119

Family Applications (1)

Application Number Title Priority Date Filing Date
JP4610281A Pending JPS56151367A (en) 1980-03-28 1981-03-28 Non-contact testing point detection of automatic tester

Country Status (8)

Country Link
US (1) US4342958A (ja)
JP (1) JPS56151367A (ja)
AU (1) AU538609B2 (ja)
CA (1) CA1164050A (ja)
DE (1) DE3111852A1 (ja)
FR (1) FR2479476A1 (ja)
IT (1) IT1142369B (ja)
YU (1) YU42237B (ja)

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DK557884A (da) * 1983-11-25 1985-05-26 Mars Inc Automatisk testudstyr
GB2157837B (en) * 1984-04-16 1988-05-18 Mars Inc Circuit testing apparatus
JPS6267474A (ja) * 1985-09-20 1987-03-27 Mitsubishi Electric Corp 半導体試験装置
US4757254A (en) * 1987-05-27 1988-07-12 Augat Inc. High-speed side access edge connector testing assembly
US4799006A (en) * 1987-06-11 1989-01-17 Augat Inc. ATE test fixture having a self-sealing vacuum skirt
GB8820042D0 (en) * 1988-08-24 1988-09-28 Bath Scient Ltd Circuit testing
US5202639A (en) * 1989-01-09 1993-04-13 Schlumberger Technologies Limited Method and apparatus for testing analogue circuits
JPH04505962A (ja) * 1989-04-05 1992-10-15 ナイツ　テクノロジー　インコーポレイテッド 集積回路を試験するための接触感知
US5019771A (en) * 1990-05-09 1991-05-28 Knights Technology, Inc. Contact sensing for integrated circuit testing
US5065092A (en) * 1990-05-14 1991-11-12 Triple S Engineering, Inc. System for locating probe tips on an integrated circuit probe card and method therefor
US5057772A (en) * 1990-05-29 1991-10-15 Electro Scientific Industries, Inc. Method and system for concurrent electronic component testing and lead verification
US5402072A (en) * 1992-02-28 1995-03-28 International Business Machines Corporation System and method for testing and fault isolation of high density passive boards and substrates
US5345170A (en) 1992-06-11 1994-09-06 Cascade Microtech, Inc. Wafer probe station having integrated guarding, Kelvin connection and shielding systems
US6380751B2 (en) 1992-06-11 2002-04-30 Cascade Microtech, Inc. Wafer probe station having environment control enclosure
GB2278965B (en) * 1993-06-07 1997-08-27 Centalic Tech Dev Ltd Testing Apparatus
US5561377A (en) 1995-04-14 1996-10-01 Cascade Microtech, Inc. System for evaluating probing networks
JP3821171B2 (ja) * 1995-11-10 2006-09-13 オー・エイチ・ティー株式会社 検査装置及び検査方法
US6037790A (en) * 1997-02-25 2000-03-14 International Business Machines Corporation In-situ contact resistance measurement for electroprocessing
US6002263A (en) 1997-06-06 1999-12-14 Cascade Microtech, Inc. Probe station having inner and outer shielding
US6087841A (en) * 1997-10-01 2000-07-11 International Business Machines Corporation Contact test circuit
US6687865B1 (en) * 1998-03-25 2004-02-03 On-Chip Technologies, Inc. On-chip service processor for test and debug of integrated circuits
US6445202B1 (en) 1999-06-30 2002-09-03 Cascade Microtech, Inc. Probe station thermal chuck with shielding for capacitive current
US6400134B1 (en) * 2000-07-17 2002-06-04 Infineon Technologies North America Corp. Automated bad socket masking in real-time for test handlers
US6914423B2 (en) 2000-09-05 2005-07-05 Cascade Microtech, Inc. Probe station
US6965226B2 (en) 2000-09-05 2005-11-15 Cascade Microtech, Inc. Chuck for holding a device under test
US6927591B2 (en) * 2000-09-22 2005-08-09 Mccord Don Method and system for wafer and device level testing of an integrated circuit
US6625554B2 (en) * 2001-06-22 2003-09-23 Hitachi, Ltd. Method and apparatus for determining a magnetic field
US6836135B2 (en) 2001-08-31 2004-12-28 Cascade Microtech, Inc. Optical testing device
US6777964B2 (en) 2002-01-25 2004-08-17 Cascade Microtech, Inc. Probe station
US6847219B1 (en) 2002-11-08 2005-01-25 Cascade Microtech, Inc. Probe station with low noise characteristics
US7250779B2 (en) 2002-11-25 2007-07-31 Cascade Microtech, Inc. Probe station with low inductance path
US6861856B2 (en) 2002-12-13 2005-03-01 Cascade Microtech, Inc. Guarded tub enclosure
WO2004070405A1 (en) * 2003-02-05 2004-08-19 Systems On Silicon Manufacturing Co. Pte. Ltd. Probe card needle cleaning frequency optimization
US7221172B2 (en) * 2003-05-06 2007-05-22 Cascade Microtech, Inc. Switched suspended conductor and connection
US7492172B2 (en) 2003-05-23 2009-02-17 Cascade Microtech, Inc. Chuck for holding a device under test
US7250626B2 (en) 2003-10-22 2007-07-31 Cascade Microtech, Inc. Probe testing structure
US7187188B2 (en) 2003-12-24 2007-03-06 Cascade Microtech, Inc. Chuck with integrated wafer support
JP2008502167A (ja) 2004-06-07 2008-01-24 カスケード マイクロテック インコーポレイテッド 熱光学チャック
US7330041B2 (en) 2004-06-14 2008-02-12 Cascade Microtech, Inc. Localizing a temperature of a device for testing
US7656172B2 (en) 2005-01-31 2010-02-02 Cascade Microtech, Inc. System for testing semiconductors
US7535247B2 (en) 2005-01-31 2009-05-19 Cascade Microtech, Inc. Interface for testing semiconductors
US7768278B2 (en) * 2007-02-14 2010-08-03 Verigy (Singapore) Pte. Ltd. High impedance, high parallelism, high temperature memory test system architecture
KR101274208B1 (ko) * 2007-08-07 2013-06-17 삼성전자주식회사 접촉 불량 검출회로를 구비하는 반도체 장치
US7977959B2 (en) * 2007-09-27 2011-07-12 Formfactor, Inc. Method and apparatus for testing devices using serially controlled intelligent switches
US8319503B2 (en) 2008-11-24 2012-11-27 Cascade Microtech, Inc. Test apparatus for measuring a characteristic of a device under test
CN107064719B (zh) * 2017-06-02 2023-09-19 北京华峰测控技术有限公司 一种开尔文连接故障检测电路及方法
CN113741386A (zh) * 2021-07-29 2021-12-03 东风电驱动系统有限公司 整车控制器线路板程序自动写入及功能检测装置及方法

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE1206524B (de) * 1963-08-26 1965-12-09 Elektromat Veb Anordnung zum Pruefen einer eine Vielzahl elektrischer Anschluesse aufweisenden Baueinheit, insbesondere der Technik gedruckter Schaltungen, auf erlaubte und unerlaubte Verbindung zwischen den Anschluessen
US3721899A (en) * 1971-10-06 1973-03-20 Us Army Continuity test and indicating circuit
IT949829B (it) * 1972-03-03 1973-06-11 Honeywell Inf Systems Dispositivo per la prova dei circuiti stampati
US3867693A (en) * 1974-02-20 1975-02-18 Ibm LSI chip test probe contact integrity checking circuit
US4114093A (en) * 1976-12-17 1978-09-12 Everett/Charles, Inc. Network testing method and apparatus

Also Published As

Publication number Publication date
US4342958A (en) 1982-08-03
AU538609B2 (en) 1984-08-23
IT1142369B (it) 1986-10-08
YU81281A (en) 1983-06-30
YU42237B (en) 1988-06-30
CA1164050A (en) 1984-03-20
AU6873381A (en) 1981-10-01
FR2479476A1 (fr) 1981-10-02
DE3111852A1 (de) 1982-02-25
DE3111852C2 (ja) 1987-11-05
IT8148127A0 (it) 1981-03-27
FR2479476B1 (ja) 1985-03-22

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