JPS56147058A - Elementary analyzer - Google Patents

Elementary analyzer

Info

Publication number
JPS56147058A
JPS56147058A JP4918480A JP4918480A JPS56147058A JP S56147058 A JPS56147058 A JP S56147058A JP 4918480 A JP4918480 A JP 4918480A JP 4918480 A JP4918480 A JP 4918480A JP S56147058 A JPS56147058 A JP S56147058A
Authority
JP
Japan
Prior art keywords
light
sample
cesium
lead
zeeman
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP4918480A
Other languages
Japanese (ja)
Inventor
Konosuke Oishi
Hideaki Koizumi
Hideo Yamada
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP4918480A priority Critical patent/JPS56147058A/en
Publication of JPS56147058A publication Critical patent/JPS56147058A/en
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/3103—Atomic absorption analysis

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)

Abstract

PURPOSE:To ensure an accurate measurement of a desired element, by irradiating the light having a wavelength the desired element absorbs selectively and the light having a wavelength the element does not absorb to the sample atomic group and thus ionizing the desired element to deliver only the ion current. CONSTITUTION:A magnetic field of about 10K gauss is applied to the light source 12 by the magnet 43. Thus the atomic spectrum of the light radiated from the light source 12 is divided into the sigma and pi components by the Zeeman effect. For instance, if a sample in which the 1ppm lead element and the 4ppm cesium element are dissolved at a time is introduced, the cesium atom does not absorb both the Zeeman pi component light and the Zeeman sigma component light that passes through the acetylene flame. As a result, the AC amplifier 36 does not deliver the current value concerning the ion current of the cesium atom. Accordingly no difference of current value exists between the sample containing cesium and the sample of only lead. Thus the quantity of lead (desired element) can be measured accurately.
JP4918480A 1980-04-16 1980-04-16 Elementary analyzer Pending JPS56147058A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP4918480A JPS56147058A (en) 1980-04-16 1980-04-16 Elementary analyzer

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP4918480A JPS56147058A (en) 1980-04-16 1980-04-16 Elementary analyzer

Publications (1)

Publication Number Publication Date
JPS56147058A true JPS56147058A (en) 1981-11-14

Family

ID=12823945

Family Applications (1)

Application Number Title Priority Date Filing Date
JP4918480A Pending JPS56147058A (en) 1980-04-16 1980-04-16 Elementary analyzer

Country Status (1)

Country Link
JP (1) JPS56147058A (en)

Similar Documents

Publication Publication Date Title
JPS51136475A (en) Light chamber used in instrument for measuring characteristics of particle
DE3370873D1 (en) Multichannel apparatus measuring the weak magnetic fields generated by different field sources
US3009098A (en) Electrical apparatus for analyzing gases
JPS56147058A (en) Elementary analyzer
Hultberg et al. Experimental and simulated beam-foil decay curves for some transitions in Zn II
ATE98798T1 (en) PROCEDURE FOR OPERATING AN IONIZATION SMOKE DETECTOR AND IONIZATION SMOKE DETECTOR.
JPS54114173A (en) Electronic probe device
SE8002697L (en) PROCEDURE AND DEVICE FOR IDENTIFYING COINS AND SIMILAR FORMS
US3086116A (en) Apparatus for determining radioactive material ratios
GB905626A (en) Improvements in or relating to a method of testing inert gases
JPS5638761A (en) Setting of magnetic field in mass spectrometer
GB837140A (en) Improvements in or relating to ion sources for mass spectrometers
JPS56154650A (en) Measuring apparatus of film blackening quantity
JPS5748662A (en) Large current measuring device
JPS5790145A (en) Measuring device for photo loss
SU1081578A1 (en) Method of determination of specimen temperature
SU723906A1 (en) Fast neutron dosimeter
JPS6453190A (en) Neutron particle measuring instrument
MacQueen A photocell experiment for secondary school physics
BEDERSON Energy-related atomic and molecular structure and scattering studies[Annual Progress Report, 1 Jul. 1979- 30 Jun. 1980]
Mingay et al. Prompt ion beam analysis by pulsed beams
JPS5753053A (en) Measuring method resolution in mass spectroscope
JPS5524365A (en) Pitch measuring device for rectangular hole of shadow mask for color braun tube
JPS5241961A (en) Apparatus for sorting fine particles
JPS5352185A (en) Measuring apparatus of ion electric current