JPS56122936A - Reflection factor measuring device - Google Patents

Reflection factor measuring device

Info

Publication number
JPS56122936A
JPS56122936A JP2592880A JP2592880A JPS56122936A JP S56122936 A JPS56122936 A JP S56122936A JP 2592880 A JP2592880 A JP 2592880A JP 2592880 A JP2592880 A JP 2592880A JP S56122936 A JPS56122936 A JP S56122936A
Authority
JP
Japan
Prior art keywords
light
light source
integral sphere
spectroscope
photodetector
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2592880A
Other languages
English (en)
Japanese (ja)
Other versions
JPS6128292B2 (enrdf_load_stackoverflow
Inventor
Yoshio Tsunasawa
Takashi Kurita
Hideki Makabe
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shimadzu Corp
Original Assignee
Shimadzu Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shimadzu Corp filed Critical Shimadzu Corp
Priority to JP2592880A priority Critical patent/JPS56122936A/ja
Publication of JPS56122936A publication Critical patent/JPS56122936A/ja
Publication of JPS6128292B2 publication Critical patent/JPS6128292B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N21/4738—Diffuse reflection, e.g. also for testing fluids, fibrous materials
    • G01N21/474—Details of optical heads therefor, e.g. using optical fibres

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
JP2592880A 1980-02-29 1980-02-29 Reflection factor measuring device Granted JPS56122936A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2592880A JPS56122936A (en) 1980-02-29 1980-02-29 Reflection factor measuring device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2592880A JPS56122936A (en) 1980-02-29 1980-02-29 Reflection factor measuring device

Publications (2)

Publication Number Publication Date
JPS56122936A true JPS56122936A (en) 1981-09-26
JPS6128292B2 JPS6128292B2 (enrdf_load_stackoverflow) 1986-06-30

Family

ID=12179429

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2592880A Granted JPS56122936A (en) 1980-02-29 1980-02-29 Reflection factor measuring device

Country Status (1)

Country Link
JP (1) JPS56122936A (enrdf_load_stackoverflow)

Cited By (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5940841U (ja) * 1982-09-07 1984-03-15 株式会社ジャパンデイスポ 変色検査用紙の測色装置
JPS60165823U (ja) * 1984-04-10 1985-11-02 大塚電子株式会社 積分球
US4553848A (en) * 1981-09-30 1985-11-19 Boehringer Mannheim Gmbh Method of detecting and evaluating photometric signals and device for carrying out the method
JPS6166147A (ja) * 1984-09-04 1986-04-04 イ−ストマン　コダック　カンパニ− 向上された効率の積分空所を備える反射計
JPS6183756A (ja) * 1984-09-29 1986-04-28 株式会社竹中工務店 組立鉄筋及びその組立鉄筋を用いた半既製コンクリ−ト版
US4682897A (en) * 1984-12-10 1987-07-28 Canon Kabushiki Kaisha Light scattering measuring apparatus
US4921351A (en) * 1987-09-04 1990-05-01 Kurashiki Boseki Kabushiki Kaisha Spectrophotometer comprising a xenon flashtube as a light source
JPH03237341A (ja) * 1989-10-20 1991-10-23 Suga Shikenki Kk 分光測色装置の光学系
US5164586A (en) * 1990-05-23 1992-11-17 Carl-Zeiss-Stiftung Arrangement for measuring the absorption of transparent specimens mounted within an integrating sphere
JPH06167391A (ja) * 1991-08-29 1994-06-14 Suga Test Instr Co Ltd ２光路測色計
JP2002353474A (ja) * 2001-05-29 2002-12-06 Mitsubishi Electric Corp 太陽電池の内部量子効率測定装置および方法

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5292775A (en) * 1976-01-30 1977-08-04 Hitachi Ltd Spectrophotometer of two light flux type
JPS5352183A (en) * 1976-09-13 1978-05-12 Kollmorgen Tech Corp Parallel detecting spectrophotometer
JPS5352180A (en) * 1976-10-22 1978-05-12 Hitachi Ltd Two light beams spectrophotometer
JPS5466190A (en) * 1977-11-04 1979-05-28 Hitachi Ltd Two luminous flux spectrophotometer
JPS54116284A (en) * 1978-03-01 1979-09-10 Hitachi Ltd Double luminous flux spectrophotometer
JPS54159282A (en) * 1978-06-07 1979-12-15 Hitachi Ltd Analog signal sampling system of spectrophotometer

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5292775A (en) * 1976-01-30 1977-08-04 Hitachi Ltd Spectrophotometer of two light flux type
JPS5352183A (en) * 1976-09-13 1978-05-12 Kollmorgen Tech Corp Parallel detecting spectrophotometer
JPS5352180A (en) * 1976-10-22 1978-05-12 Hitachi Ltd Two light beams spectrophotometer
JPS5466190A (en) * 1977-11-04 1979-05-28 Hitachi Ltd Two luminous flux spectrophotometer
JPS54116284A (en) * 1978-03-01 1979-09-10 Hitachi Ltd Double luminous flux spectrophotometer
JPS54159282A (en) * 1978-06-07 1979-12-15 Hitachi Ltd Analog signal sampling system of spectrophotometer

Cited By (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4553848A (en) * 1981-09-30 1985-11-19 Boehringer Mannheim Gmbh Method of detecting and evaluating photometric signals and device for carrying out the method
JPS5940841U (ja) * 1982-09-07 1984-03-15 株式会社ジャパンデイスポ 変色検査用紙の測色装置
JPS60165823U (ja) * 1984-04-10 1985-11-02 大塚電子株式会社 積分球
JPS6166147A (ja) * 1984-09-04 1986-04-04 イ−ストマン　コダック　カンパニ− 向上された効率の積分空所を備える反射計
JPS6183756A (ja) * 1984-09-29 1986-04-28 株式会社竹中工務店 組立鉄筋及びその組立鉄筋を用いた半既製コンクリ−ト版
US4682897A (en) * 1984-12-10 1987-07-28 Canon Kabushiki Kaisha Light scattering measuring apparatus
US4921351A (en) * 1987-09-04 1990-05-01 Kurashiki Boseki Kabushiki Kaisha Spectrophotometer comprising a xenon flashtube as a light source
JPH03237341A (ja) * 1989-10-20 1991-10-23 Suga Shikenki Kk 分光測色装置の光学系
US5164586A (en) * 1990-05-23 1992-11-17 Carl-Zeiss-Stiftung Arrangement for measuring the absorption of transparent specimens mounted within an integrating sphere
JPH06167391A (ja) * 1991-08-29 1994-06-14 Suga Test Instr Co Ltd ２光路測色計
JP2002353474A (ja) * 2001-05-29 2002-12-06 Mitsubishi Electric Corp 太陽電池の内部量子効率測定装置および方法

Also Published As

Publication number Publication date
JPS6128292B2 (enrdf_load_stackoverflow) 1986-06-30

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