JPS54116284A - Double luminous flux spectrophotometer - Google Patents
Double luminous flux spectrophotometerInfo
- Publication number
- JPS54116284A JPS54116284A JP2213078A JP2213078A JPS54116284A JP S54116284 A JPS54116284 A JP S54116284A JP 2213078 A JP2213078 A JP 2213078A JP 2213078 A JP2213078 A JP 2213078A JP S54116284 A JPS54116284 A JP S54116284A
- Authority
- JP
- Japan
- Prior art keywords
- difference
- flicker
- light
- reflecting
- rotary
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 230000004907 flux Effects 0.000 title 1
- 238000001514 detection method Methods 0.000 abstract 2
- 101700004678 SLIT3 Proteins 0.000 abstract 1
- 102100027339 Slit homolog 3 protein Human genes 0.000 abstract 1
- 230000005540 biological transmission Effects 0.000 abstract 1
- 238000010183 spectrum analysis Methods 0.000 abstract 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/10—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void
- G01J1/20—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void intensity of the measured or reference value being varied to equalise their effects at the detectors, e.g. by varying incidence angle
- G01J1/34—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void intensity of the measured or reference value being varied to equalise their effects at the detectors, e.g. by varying incidence angle using separate light paths used alternately or sequentially, e.g. flicker
- G01J1/36—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void intensity of the measured or reference value being varied to equalise their effects at the detectors, e.g. by varying incidence angle using separate light paths used alternately or sequentially, e.g. flicker using electric radiation detectors
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Spectrometry And Color Measurement (AREA)
Abstract
PURPOSE:To cancel the difference in the quantity of light due to difference in the reflecting parts of a rotary flicker device in a signal processing system, by integer- multiple-integrating the detected signals of sample light and reference light respectively in response to the number of reflecting members of the rotary flicker device. CONSTITUTION:A monochromatic light from a slit 3 of a spectroscope is reflected by the reflecting part of a rotary flicker device 10 to become a reference light and, simultaneously, become a sample light by transmitting through the sample provided in the transmission part, and the both lights are alternately detected by a detector 6 through a similar flicker device 10' which turns in synchronism with the flicker device 10. The both detection outputs of this detector 6 are passed through an A/D converter 30 and a memory 31 to be integrated by the integer multiples in a digital operation unit, depending on the number of the reflecting parts in the flicker devices 10, 10' thereby becoming a detection output with the difference in the quantity of light due to difference of reflecting parts canceled each other. Therefore, spectral analysis is possible without being influenced by the difference of the reflecting parts in the flicker devices.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2213078A JPS54116284A (en) | 1978-03-01 | 1978-03-01 | Double luminous flux spectrophotometer |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2213078A JPS54116284A (en) | 1978-03-01 | 1978-03-01 | Double luminous flux spectrophotometer |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS54116284A true JPS54116284A (en) | 1979-09-10 |
Family
ID=12074295
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2213078A Pending JPS54116284A (en) | 1978-03-01 | 1978-03-01 | Double luminous flux spectrophotometer |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS54116284A (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS56122936A (en) * | 1980-02-29 | 1981-09-26 | Shimadzu Corp | Reflection factor measuring device |
-
1978
- 1978-03-01 JP JP2213078A patent/JPS54116284A/en active Pending
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS56122936A (en) * | 1980-02-29 | 1981-09-26 | Shimadzu Corp | Reflection factor measuring device |
| JPS6128292B2 (en) * | 1980-02-29 | 1986-06-30 | Shimadzu Corp |
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