JPS56114771A - Insulation testing method for electromagnetic package - Google Patents

Insulation testing method for electromagnetic package

Info

Publication number
JPS56114771A
JPS56114771A JP1596280A JP1596280A JPS56114771A JP S56114771 A JPS56114771 A JP S56114771A JP 1596280 A JP1596280 A JP 1596280A JP 1596280 A JP1596280 A JP 1596280A JP S56114771 A JPS56114771 A JP S56114771A
Authority
JP
Japan
Prior art keywords
terminals
insulation test
negative voltage
positive voltage
testing method
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP1596280A
Other languages
Japanese (ja)
Inventor
Toshikatsu Kiriyama
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP1596280A priority Critical patent/JPS56114771A/en
Publication of JPS56114771A publication Critical patent/JPS56114771A/en
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
    • G01R31/52—Testing for short-circuits, leakage current or ground faults

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)

Abstract

PURPOSE:To prevent an omission in insulation test while shortening the time of the insulation test greatly by giving insulation test between great number of adjacent terminals at random and by covering all combinations by a small number of insulation test patterns. CONSTITUTION:While terminal names of an electromagnetic package are ignored, terminal numbers No.(1-N) are given at random. In the 1st insulation test pattern, terminals No.(1-N/2) are applied with a positive voltage and terminals No.(N/2+ 1-N) are applied with a negative voltage. In the 2nd pattern, terminals No.(1- N/4) and (N/2+-3N/4) are applied with the positive voltage, and terminals No.(N/4+1-N/2) and (3N/4+1-N) with the negative voltage. Then, N terminals are divided by 21, 2<2>, 2<3>...2<n>, at the n-th insulation test pattern, odd-numbered terminals 1, 3...N-1 are applied with the positive voltage, and even-numbered terminals No.2, 4...N with the negative voltage. Thus, the time of insulation test covering all combinations of adjacent terminals is shortened greatly to prevent an omission in the insulation test.
JP1596280A 1980-02-14 1980-02-14 Insulation testing method for electromagnetic package Pending JPS56114771A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1596280A JPS56114771A (en) 1980-02-14 1980-02-14 Insulation testing method for electromagnetic package

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1596280A JPS56114771A (en) 1980-02-14 1980-02-14 Insulation testing method for electromagnetic package

Publications (1)

Publication Number Publication Date
JPS56114771A true JPS56114771A (en) 1981-09-09

Family

ID=11903343

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1596280A Pending JPS56114771A (en) 1980-02-14 1980-02-14 Insulation testing method for electromagnetic package

Country Status (1)

Country Link
JP (1) JPS56114771A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0518068A1 (en) * 1991-06-10 1992-12-16 GRUNDIG E.M.V. Elektro-Mechanische Versuchsanstalt Max Grundig holländ. Stiftung & Co. KG. Method for testing display circuits and arrangement for implementing said method
JP2010175489A (en) * 2009-02-02 2010-08-12 Hioki Ee Corp Circuit board inspecting apparatus and circuit board inspecting method
CN103592578A (en) * 2012-08-16 2014-02-19 神讯电脑(昆山)有限公司 High-voltage insulation tester of cable

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0518068A1 (en) * 1991-06-10 1992-12-16 GRUNDIG E.M.V. Elektro-Mechanische Versuchsanstalt Max Grundig holländ. Stiftung & Co. KG. Method for testing display circuits and arrangement for implementing said method
JP2010175489A (en) * 2009-02-02 2010-08-12 Hioki Ee Corp Circuit board inspecting apparatus and circuit board inspecting method
CN103592578A (en) * 2012-08-16 2014-02-19 神讯电脑(昆山)有限公司 High-voltage insulation tester of cable

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