JPS5313841A - Test method for core memory unit - Google Patents

Test method for core memory unit

Info

Publication number
JPS5313841A
JPS5313841A JP8813276A JP8813276A JPS5313841A JP S5313841 A JPS5313841 A JP S5313841A JP 8813276 A JP8813276 A JP 8813276A JP 8813276 A JP8813276 A JP 8813276A JP S5313841 A JPS5313841 A JP S5313841A
Authority
JP
Japan
Prior art keywords
memory unit
test method
core memory
interferences
semiselecting
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP8813276A
Other languages
Japanese (ja)
Inventor
Kazuaki Shiroyama
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP8813276A priority Critical patent/JPS5313841A/en
Publication of JPS5313841A publication Critical patent/JPS5313841A/en
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/02—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements
    • G11C11/06—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements using single-aperture storage elements, e.g. ring core; using multi-aperture plates in which each individual aperture forms a storage element

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Techniques For Improving Reliability Of Storages (AREA)

Abstract

PURPOSE:To make easily detectable for the effect of the semiselecting current on the semi-selection cores, by making the number of interferences enable to arbitrarily for a number of times and increasing the number of interferences.
JP8813276A 1976-07-26 1976-07-26 Test method for core memory unit Pending JPS5313841A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP8813276A JPS5313841A (en) 1976-07-26 1976-07-26 Test method for core memory unit

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP8813276A JPS5313841A (en) 1976-07-26 1976-07-26 Test method for core memory unit

Publications (1)

Publication Number Publication Date
JPS5313841A true JPS5313841A (en) 1978-02-07

Family

ID=13934389

Family Applications (1)

Application Number Title Priority Date Filing Date
JP8813276A Pending JPS5313841A (en) 1976-07-26 1976-07-26 Test method for core memory unit

Country Status (1)

Country Link
JP (1) JPS5313841A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5937690A (en) * 1982-08-25 1984-03-01 三洋電機株式会社 Induction heating cooking device

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5937690A (en) * 1982-08-25 1984-03-01 三洋電機株式会社 Induction heating cooking device

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