JPS5578263A - Semiconductor integrated circuit - Google Patents
Semiconductor integrated circuitInfo
- Publication number
- JPS5578263A JPS5578263A JP15254278A JP15254278A JPS5578263A JP S5578263 A JPS5578263 A JP S5578263A JP 15254278 A JP15254278 A JP 15254278A JP 15254278 A JP15254278 A JP 15254278A JP S5578263 A JPS5578263 A JP S5578263A
- Authority
- JP
- Japan
- Prior art keywords
- test mode
- circuit
- level
- signal
- exceeds
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/31701—Arrangements for setting the Unit Under Test [UUT] in a test mode
Landscapes
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Tests Of Electronic Circuits (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Semiconductor Integrated Circuits (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP15254278A JPS5578263A (en) | 1978-12-08 | 1978-12-08 | Semiconductor integrated circuit |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP15254278A JPS5578263A (en) | 1978-12-08 | 1978-12-08 | Semiconductor integrated circuit |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5578263A true JPS5578263A (en) | 1980-06-12 |
JPS6219709B2 JPS6219709B2 (US20030204162A1-20031030-M00001.png) | 1987-04-30 |
Family
ID=15542723
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP15254278A Granted JPS5578263A (en) | 1978-12-08 | 1978-12-08 | Semiconductor integrated circuit |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5578263A (US20030204162A1-20031030-M00001.png) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4612499A (en) * | 1983-11-07 | 1986-09-16 | Texas Instruments Incorporated | Test input demultiplexing circuit |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5396740A (en) * | 1977-02-04 | 1978-08-24 | Hitachi Ltd | Test system |
-
1978
- 1978-12-08 JP JP15254278A patent/JPS5578263A/ja active Granted
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5396740A (en) * | 1977-02-04 | 1978-08-24 | Hitachi Ltd | Test system |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4612499A (en) * | 1983-11-07 | 1986-09-16 | Texas Instruments Incorporated | Test input demultiplexing circuit |
Also Published As
Publication number | Publication date |
---|---|
JPS6219709B2 (US20030204162A1-20031030-M00001.png) | 1987-04-30 |
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