JPS5574407A - Measurement of shape of light beam - Google Patents

Measurement of shape of light beam

Info

Publication number
JPS5574407A
JPS5574407A JP14801878A JP14801878A JPS5574407A JP S5574407 A JPS5574407 A JP S5574407A JP 14801878 A JP14801878 A JP 14801878A JP 14801878 A JP14801878 A JP 14801878A JP S5574407 A JPS5574407 A JP S5574407A
Authority
JP
Japan
Prior art keywords
elements
light beam
shape
measurement
outputs
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP14801878A
Other languages
Japanese (ja)
Inventor
Fumitaka Abe
Tomohisa Mikami
Fumio Sakurai
Tadashi Matsuda
Takayuki Kokai
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP14801878A priority Critical patent/JPS5574407A/en
Publication of JPS5574407A publication Critical patent/JPS5574407A/en
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00Photometry, e.g. photographic exposure meter
    • G01J1/42Photometry, e.g. photographic exposure meter using electric radiation detectors
    • G01J1/4257Photometry, e.g. photographic exposure meter using electric radiation detectors applied to monitoring the characteristics of a beam, e.g. laser beam, headlamp beam

Abstract

PURPOSE: To detect the shape of light beam by the distribution of outputs of solid image pickup elements by applying the light beam to the elements array in which plural elements are arranged with a pitch sufficiently less than the diameter of measured part of the light beam.
CONSTITUTION: The solid image pickup elements array A consists of multiple elements i that are arranged in a row. The elements are made of photodiodes and charge bond elements and are arranged with a minute pitch sufficiently less than the diameter of light beam B. The distribution of outputs of respective elements can be obtained to know the sectional shape of beam B.
COPYRIGHT: (C)1980,JPO&Japio
JP14801878A 1978-11-30 1978-11-30 Measurement of shape of light beam Pending JPS5574407A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP14801878A JPS5574407A (en) 1978-11-30 1978-11-30 Measurement of shape of light beam

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP14801878A JPS5574407A (en) 1978-11-30 1978-11-30 Measurement of shape of light beam

Publications (1)

Publication Number Publication Date
JPS5574407A true JPS5574407A (en) 1980-06-05

Family

ID=15443256

Family Applications (1)

Application Number Title Priority Date Filing Date
JP14801878A Pending JPS5574407A (en) 1978-11-30 1978-11-30 Measurement of shape of light beam

Country Status (1)

Country Link
JP (1) JPS5574407A (en)

Cited By (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5734601A (en) * 1980-08-12 1982-02-25 Koito Mfg Co Ltd Optical axis detector for automotive headlight
JPS5734602A (en) * 1980-08-12 1982-02-25 Koito Mfg Co Ltd Optical axis detector for automotive headlight
JPS57135334A (en) * 1981-02-17 1982-08-20 Koito Mfg Co Ltd Optical axis detecting device of car head light
JPS5862247U (en) * 1981-10-21 1983-04-26 株式会社リコー lens aperture meter
US4693599A (en) * 1982-11-26 1987-09-15 National Research Development Corporation Apparatus for measuring light beam characteristics
US4712914A (en) * 1986-01-10 1987-12-15 Westinghouse Electric Corp. Device for characterizing wide angle beams
US5100231A (en) * 1989-04-27 1992-03-31 Coherent, Inc. Apparatus for measuring the mode quality of a laser beam
US5214485A (en) * 1989-04-27 1993-05-25 Coherent, Inc. Apparatus for measuring the mode quality of a laser beam
US5493391A (en) * 1994-07-11 1996-02-20 Sandia Corporation One dimensional wavefront distortion sensor comprising a lens array system
US5499094A (en) * 1994-12-21 1996-03-12 Eastman Kodak Company Apparatus and method for measuring the length and width of a spot of light utilizing two different masks

Cited By (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5734601A (en) * 1980-08-12 1982-02-25 Koito Mfg Co Ltd Optical axis detector for automotive headlight
JPS5734602A (en) * 1980-08-12 1982-02-25 Koito Mfg Co Ltd Optical axis detector for automotive headlight
JPH0222329B2 (en) * 1980-08-12 1990-05-18 Koito Mfg Co Ltd
JPS57135334A (en) * 1981-02-17 1982-08-20 Koito Mfg Co Ltd Optical axis detecting device of car head light
JPS5862247U (en) * 1981-10-21 1983-04-26 株式会社リコー lens aperture meter
JPH0219709Y2 (en) * 1981-10-21 1990-05-30
US4693599A (en) * 1982-11-26 1987-09-15 National Research Development Corporation Apparatus for measuring light beam characteristics
US4712914A (en) * 1986-01-10 1987-12-15 Westinghouse Electric Corp. Device for characterizing wide angle beams
US5100231A (en) * 1989-04-27 1992-03-31 Coherent, Inc. Apparatus for measuring the mode quality of a laser beam
US5214485A (en) * 1989-04-27 1993-05-25 Coherent, Inc. Apparatus for measuring the mode quality of a laser beam
US5493391A (en) * 1994-07-11 1996-02-20 Sandia Corporation One dimensional wavefront distortion sensor comprising a lens array system
US5499094A (en) * 1994-12-21 1996-03-12 Eastman Kodak Company Apparatus and method for measuring the length and width of a spot of light utilizing two different masks

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