JPS5569069A - Testing method for dampproof property of semiconductor device - Google Patents
Testing method for dampproof property of semiconductor deviceInfo
- Publication number
- JPS5569069A JPS5569069A JP14445478A JP14445478A JPS5569069A JP S5569069 A JPS5569069 A JP S5569069A JP 14445478 A JP14445478 A JP 14445478A JP 14445478 A JP14445478 A JP 14445478A JP S5569069 A JPS5569069 A JP S5569069A
- Authority
- JP
- Japan
- Prior art keywords
- semiconductor device
- temperature
- saturated
- reverse bias
- pressure
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Abstract
PURPOSE: To appreciate a semiconductor device in a short time and also to prevent the external lead of the device from corroding by applying a reverse bias at a high temperature after preserving the semiconductor device in a high-temperature, high-pressure and saturated-vapor atmosphere.
CONSTITUTION: Sample 2 of a semiconductor device is preserved in case 5, kept in a high-temperature, high-pressure and saturated-vapor state, of high-pressure container 1a, and internal elements are dampened as rapidly as possible. Then, sample 2 is put in high-temperature furnace 6 and applied with a reverse bias from terminal 7 to facilitate reaction between damp and elements for a test of resistance to damp. As a result, since reaction is accelerated, appreciation is done in a short time and no reverse bias is applied in saturated vapor, so that the external lead of the semiconductor device can be prevented from corroding.
COPYRIGHT: (C)1980,JPO&Japio
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP14445478A JPS5569069A (en) | 1978-11-20 | 1978-11-20 | Testing method for dampproof property of semiconductor device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP14445478A JPS5569069A (en) | 1978-11-20 | 1978-11-20 | Testing method for dampproof property of semiconductor device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS5569069A true JPS5569069A (en) | 1980-05-24 |
Family
ID=15362615
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP14445478A Pending JPS5569069A (en) | 1978-11-20 | 1978-11-20 | Testing method for dampproof property of semiconductor device |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5569069A (en) |
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5879139A (en) * | 1981-11-06 | 1983-05-12 | Hitachi Ltd | Testing method for damp-proof property of semiconductor device |
| JPS59112269A (en) * | 1982-11-25 | 1984-06-28 | Matsushita Electric Ind Co Ltd | Testing method of semiconductor device |
| JPS59182400A (en) * | 1983-02-11 | 1984-10-17 | ザ タウ ケミカル カンパニ− | Cesium removing method, purification of coolant in boiling and pressing water , and mixed ion exchang rasin |
| JPS59191642U (en) * | 1983-06-06 | 1984-12-19 | 株式会社 千代田製作所 | Environmental tester |
| US7120073B2 (en) * | 2002-08-29 | 2006-10-10 | Micron Technology, Inc. | Integrated circuit devices having reducing variable retention characteristics |
| CN108169654A (en) * | 2018-01-02 | 2018-06-15 | 中国电子产品可靠性与环境试验研究所（（工业和信息化部电子第五研究所）（中国赛宝实验室）） | Power module HTRB reliability test systems |
-
1978
- 1978-11-20 JP JP14445478A patent/JPS5569069A/en active Pending
Cited By (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5879139A (en) * | 1981-11-06 | 1983-05-12 | Hitachi Ltd | Testing method for damp-proof property of semiconductor device |
| JPH0249456B2 (en) * | 1981-11-06 | 1990-10-30 | Hitachi Ltd | |
| JPS59112269A (en) * | 1982-11-25 | 1984-06-28 | Matsushita Electric Ind Co Ltd | Testing method of semiconductor device |
| JPS59182400A (en) * | 1983-02-11 | 1984-10-17 | ザ タウ ケミカル カンパニ− | Cesium removing method, purification of coolant in boiling and pressing water , and mixed ion exchang rasin |
| JPS59191642U (en) * | 1983-06-06 | 1984-12-19 | 株式会社 千代田製作所 | Environmental tester |
| JPH0320763Y2 (en) * | 1983-06-06 | 1991-05-07 | ||
| US7120073B2 (en) * | 2002-08-29 | 2006-10-10 | Micron Technology, Inc. | Integrated circuit devices having reducing variable retention characteristics |
| CN108169654A (en) * | 2018-01-02 | 2018-06-15 | 中国电子产品可靠性与环境试验研究所（（工业和信息化部电子第五研究所）（中国赛宝实验室）） | Power module HTRB reliability test systems |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| JPS5569069A (en) | Testing method for dampproof property of semiconductor device | |
| JPS5213078A (en) | Gas enclosing method of a sealing-shaped cylinder device | |
| JPS5721825A (en) | Increasing method for gettering effect due to internal defect in semiconductor substrate | |
| JPS5223985A (en) | Method of detecting flaws of springs | |
| JPS53144682A (en) | Testing method of semiconductor devices | |
| JPS5550134A (en) | Moisture resistance testing method of resin sealed type semiconductor device | |
| JPS5214482A (en) | Method of extracting test sample gas | |
| JPS545785A (en) | Non-destructive inspecting apparatus | |
| JPS53149392A (en) | Specimen injector of gas chromatograph | |
| JPS5421390A (en) | Inspecting method of closed objects | |
| JPS5543417A (en) | Stress corrosion cracking test method | |
| JPS5338266A (en) | Screening method of semiconductors and device for the same | |
| JPS536575A (en) | Testing method of electronic parts | |
| JPS5526468A (en) | Testing method of semiconductor element | |
| JPS5379467A (en) | Reliability testing method for simiconductor device | |
| JPS51149738A (en) | Method of testing electeronic computers | |
| JPS5227378A (en) | Wafer test method | |
| JPS5226420A (en) | Temperature testing process of transformer | |
| JPS51139287A (en) | Semi-conductor integrated circuit device | |
| JPS5375862A (en) | Surface stabilization method of semiconductor | |
| JPS5310277A (en) | Testing method of semiconductor elements | |
| JPS5311162A (en) | Denitrating method for flue gas | |
| JPS51147176A (en) | Method of semiconductor package | |
| JPS5414127A (en) | Test method of memory unit and its unit | |
| JPS5225568A (en) | Production method of semiconductor element |