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Fuji Electric Co Ltd
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Fuji Electric Co Ltd
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Publication date
Application filed by Fuji Electric Co LtdfiledCriticalFuji Electric Co Ltd
Priority to JP15579076ApriorityCriticalpatent/JPS5379467A/en
Publication of JPS5379467ApublicationCriticalpatent/JPS5379467A/en
PURPOSE: To perform a reliability test simply in an extremely short time based on the variation of the characteristics which is caused through an extremely short time heat treatment of the semiconductor pellet in the air.
COPYRIGHT: (C)1978,JPO&Japio
JP15579076A1976-12-241976-12-24Reliability testing method for simiconductor device
PendingJPS5379467A
(en)