JPS5563445A - Diagnosis system - Google Patents

Diagnosis system

Info

Publication number
JPS5563445A
JPS5563445A JP13689278A JP13689278A JPS5563445A JP S5563445 A JPS5563445 A JP S5563445A JP 13689278 A JP13689278 A JP 13689278A JP 13689278 A JP13689278 A JP 13689278A JP S5563445 A JPS5563445 A JP S5563445A
Authority
JP
Japan
Prior art keywords
failure
expected value
register
suspected
simulator
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP13689278A
Other languages
Japanese (ja)
Other versions
JPS6030978B2 (en
Inventor
Jiro Hisayuki
Masami Kushihashi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP53136892A priority Critical patent/JPS6030978B2/en
Publication of JPS5563445A publication Critical patent/JPS5563445A/en
Publication of JPS6030978B2 publication Critical patent/JPS6030978B2/en
Expired legal-status Critical Current

Links

Landscapes

  • Test And Diagnosis Of Digital Computers (AREA)

Abstract

PURPOSE: To make unnecessary the provision of the expected value and the failure dictionary, by obtaining the expected value and the suspected failure point group of the output condition of the diagnosed unit with the simulator in failure and comparing the output state of the diagnosed unit and the said expected value, in the diagnosis system of the logic circuit.
CONSTITUTION: The test data of the test data file 1 is read out with the scan out control section 6 of the test input 1, and this is set to the test application register 2 and fed to the diagnosed unit 3. Next, the failure simulation is made for one cycle by using the failure simulator 10, and the expected value and the suspected failure point obtained are set to the register 12 and the buffer 11. Next, the expected value of the register 12 and the content of the response state register 7 are compared at the comparison logic section 13, and if it is in error, it is displayed on the display section 16 via the error information register 14 and the suspected failure determining logic section 15.
COPYRIGHT: (C)1980,JPO&Japio
JP53136892A 1978-11-07 1978-11-07 Diagnostic method Expired JPS6030978B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP53136892A JPS6030978B2 (en) 1978-11-07 1978-11-07 Diagnostic method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP53136892A JPS6030978B2 (en) 1978-11-07 1978-11-07 Diagnostic method

Publications (2)

Publication Number Publication Date
JPS5563445A true JPS5563445A (en) 1980-05-13
JPS6030978B2 JPS6030978B2 (en) 1985-07-19

Family

ID=15185985

Family Applications (1)

Application Number Title Priority Date Filing Date
JP53136892A Expired JPS6030978B2 (en) 1978-11-07 1978-11-07 Diagnostic method

Country Status (1)

Country Link
JP (1) JPS6030978B2 (en)

Also Published As

Publication number Publication date
JPS6030978B2 (en) 1985-07-19

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