JPS554034A - Defect checking method of optical display cell - Google Patents

Defect checking method of optical display cell

Info

Publication number
JPS554034A
JPS554034A JP7626478A JP7626478A JPS554034A JP S554034 A JPS554034 A JP S554034A JP 7626478 A JP7626478 A JP 7626478A JP 7626478 A JP7626478 A JP 7626478A JP S554034 A JPS554034 A JP S554034A
Authority
JP
Japan
Prior art keywords
cells
electrodes
defective
check
fail
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP7626478A
Other languages
Japanese (ja)
Inventor
Jun Takahashi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Casio Computer Co Ltd
Original Assignee
Casio Computer Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Casio Computer Co Ltd filed Critical Casio Computer Co Ltd
Priority to JP7626478A priority Critical patent/JPS554034A/en
Publication of JPS554034A publication Critical patent/JPS554034A/en
Pending legal-status Critical Current

Links

Landscapes

  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
  • Liquid Crystal (AREA)
  • Devices For Indicating Variable Information By Combining Individual Elements (AREA)

Abstract

PURPOSE: To improve production efficiency by beforehand forming the check wirings for commonly connecting respective electrodes to electrode substrates and detecting defective cells before the separation of cell assembly blanks.
CONSTITUTION: Respective electrodes 2, 3 of cell blocks A, B, C, D are beforehand commonly connected by way of check wirings a, b, c and voltage is simultaneously applied between all the electrodes 2, 3 of the cells corresponding to the blocks A thru D. In this case, all the cells assume the sate of displaying a figure "8" and therefore the cells which fail to perfectly display to visual check "8" (lead disconnection of segment electrodes) or fail to display the same at all (lead disconnection of common electrodes), etc. are detected and are judged to be defectives. The cell assembly blank having undergone defective checking is divided along dividing lines 12 to individual cells, after which the non-defective cells are sent to the next process, where they are subjected to sealing of liquid crystal injection ports, etc., whereby they are made to finished products. Since in this way defective checking is accomplished in the intermediate process, the efficiency of production may be improved.
COPYRIGHT: (C)1980,JPO&Japio
JP7626478A 1978-06-23 1978-06-23 Defect checking method of optical display cell Pending JPS554034A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP7626478A JPS554034A (en) 1978-06-23 1978-06-23 Defect checking method of optical display cell

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP7626478A JPS554034A (en) 1978-06-23 1978-06-23 Defect checking method of optical display cell

Publications (1)

Publication Number Publication Date
JPS554034A true JPS554034A (en) 1980-01-12

Family

ID=13600357

Family Applications (1)

Application Number Title Priority Date Filing Date
JP7626478A Pending JPS554034A (en) 1978-06-23 1978-06-23 Defect checking method of optical display cell

Country Status (1)

Country Link
JP (1) JPS554034A (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH02222925A (en) * 1988-11-07 1990-09-05 Matsushita Electric Ind Co Ltd Production of liquid crystal panel
JPH05341246A (en) * 1992-06-11 1993-12-24 Sharp Corp Manufacture of matrix type display element
US5684546A (en) * 1994-10-06 1997-11-04 Samsung Electronics Co., Ltd. Electrostatic discharge protective circuit in a liquid crystal display
JP2007232767A (en) * 2006-02-27 2007-09-13 Bridgestone Corp Mother substrate for information display

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH02222925A (en) * 1988-11-07 1990-09-05 Matsushita Electric Ind Co Ltd Production of liquid crystal panel
JPH05341246A (en) * 1992-06-11 1993-12-24 Sharp Corp Manufacture of matrix type display element
US5684546A (en) * 1994-10-06 1997-11-04 Samsung Electronics Co., Ltd. Electrostatic discharge protective circuit in a liquid crystal display
JP2007232767A (en) * 2006-02-27 2007-09-13 Bridgestone Corp Mother substrate for information display

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