JPS55162227A - Microprojection exposure device - Google Patents
Microprojection exposure deviceInfo
- Publication number
- JPS55162227A JPS55162227A JP6897179A JP6897179A JPS55162227A JP S55162227 A JPS55162227 A JP S55162227A JP 6897179 A JP6897179 A JP 6897179A JP 6897179 A JP6897179 A JP 6897179A JP S55162227 A JPS55162227 A JP S55162227A
- Authority
- JP
- Japan
- Prior art keywords
- wafer
- slit
- alignment pattern
- optical system
- reticle
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 230000003287 optical effect Effects 0.000 abstract 3
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F9/00—Registration or positioning of originals, masks, frames, photographic sheets or textured or patterned surfaces, e.g. automatically
- G03F9/70—Registration or positioning of originals, masks, frames, photographic sheets or textured or patterned surfaces, e.g. automatically for microlithography
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
Landscapes
- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- General Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
- Projection-Type Copiers In General (AREA)
- Length Measuring Devices By Optical Means (AREA)
Priority Applications (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP6897179A JPS55162227A (en) | 1979-06-04 | 1979-06-04 | Microprojection exposure device |
EP19800103125 EP0019941B1 (en) | 1979-06-04 | 1980-06-04 | Reduction projection aligner system |
DE8080103125T DE3071137D1 (en) | 1979-06-04 | 1980-06-04 | Reduction projection aligner system |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP6897179A JPS55162227A (en) | 1979-06-04 | 1979-06-04 | Microprojection exposure device |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS55162227A true JPS55162227A (en) | 1980-12-17 |
JPS5748853B2 JPS5748853B2 (ja) | 1982-10-19 |
Family
ID=13389057
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP6897179A Granted JPS55162227A (en) | 1979-06-04 | 1979-06-04 | Microprojection exposure device |
Country Status (3)
Country | Link |
---|---|
EP (1) | EP0019941B1 (ja) |
JP (1) | JPS55162227A (ja) |
DE (1) | DE3071137D1 (ja) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS57138134A (en) * | 1981-02-20 | 1982-08-26 | Nippon Kogaku Kk <Nikon> | Positioning device |
JPH07183213A (ja) * | 1994-09-30 | 1995-07-21 | Hitachi Ltd | 投影露光方法 |
Families Citing this family (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS58108745A (ja) * | 1981-12-23 | 1983-06-28 | Canon Inc | 転写装置 |
JPS58193547A (ja) * | 1982-05-07 | 1983-11-11 | Hitachi Ltd | 縮小投影露光装置 |
JPS5998525A (ja) * | 1982-11-26 | 1984-06-06 | Canon Inc | 分割焼付け装置のアライメント方法 |
FR2566217B1 (fr) * | 1984-05-28 | 1988-05-27 | Micro Controle | Procede et dispositif pour la reconnaissance d'un motif particulier d'une image |
Family Cites Families (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3796497A (en) * | 1971-12-01 | 1974-03-12 | Ibm | Optical alignment method and apparatus |
US3943359A (en) * | 1973-06-15 | 1976-03-09 | Hitachi, Ltd. | Apparatus for relatively positioning a plurality of objects by the use of a scanning optoelectric microscope |
US4052603A (en) * | 1974-12-23 | 1977-10-04 | International Business Machines Corporation | Object positioning process and apparatus |
-
1979
- 1979-06-04 JP JP6897179A patent/JPS55162227A/ja active Granted
-
1980
- 1980-06-04 DE DE8080103125T patent/DE3071137D1/de not_active Expired
- 1980-06-04 EP EP19800103125 patent/EP0019941B1/en not_active Expired
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS57138134A (en) * | 1981-02-20 | 1982-08-26 | Nippon Kogaku Kk <Nikon> | Positioning device |
JPH0441483B2 (ja) * | 1981-02-20 | 1992-07-08 | Nippon Kogaku Kk | |
JPH07183213A (ja) * | 1994-09-30 | 1995-07-21 | Hitachi Ltd | 投影露光方法 |
Also Published As
Publication number | Publication date |
---|---|
EP0019941A1 (en) | 1980-12-10 |
EP0019941B1 (en) | 1985-10-02 |
JPS5748853B2 (ja) | 1982-10-19 |
DE3071137D1 (en) | 1985-11-07 |
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