JPS55155353A - Developer composition - Google Patents
Developer compositionInfo
- Publication number
- JPS55155353A JPS55155353A JP6222679A JP6222679A JPS55155353A JP S55155353 A JPS55155353 A JP S55155353A JP 6222679 A JP6222679 A JP 6222679A JP 6222679 A JP6222679 A JP 6222679A JP S55155353 A JPS55155353 A JP S55155353A
- Authority
- JP
- Japan
- Prior art keywords
- xylene
- butyl acetate
- developer composition
- recovered
- developer
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- DKPFZGUDAPQIHT-UHFFFAOYSA-N butyl acetate Chemical compound CCCCOC(C)=O DKPFZGUDAPQIHT-UHFFFAOYSA-N 0.000 abstract 6
- CTQNGGLPUBDAKN-UHFFFAOYSA-N O-Xylene Chemical compound CC1=CC=CC=C1C CTQNGGLPUBDAKN-UHFFFAOYSA-N 0.000 abstract 4
- 239000008096 xylene Substances 0.000 abstract 4
- 229920002120 photoresistant polymer Polymers 0.000 abstract 2
- 238000004821 distillation Methods 0.000 abstract 1
- 239000002699 waste material Substances 0.000 abstract 1
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/26—Processing photosensitive materials; Apparatus therefor
- G03F7/30—Imagewise removal using liquid means
- G03F7/32—Liquid compositions therefor, e.g. developers
- G03F7/325—Non-aqueous compositions
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
- Photosensitive Polymer And Photoresist Processing (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP6222679A JPS55155353A (en) | 1979-05-22 | 1979-05-22 | Developer composition |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP6222679A JPS55155353A (en) | 1979-05-22 | 1979-05-22 | Developer composition |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS55155353A true JPS55155353A (en) | 1980-12-03 |
| JPH0238942B2 JPH0238942B2 (enrdf_load_stackoverflow) | 1990-09-03 |
Family
ID=13194023
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP6222679A Granted JPS55155353A (en) | 1979-05-22 | 1979-05-22 | Developer composition |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS55155353A (enrdf_load_stackoverflow) |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS56101148A (en) * | 1980-01-16 | 1981-08-13 | Toshiba Corp | Photoresist developing method |
| JPS592043A (ja) * | 1982-06-29 | 1984-01-07 | Fujitsu Ltd | フオトレジストの現像方法 |
| JPS6043826A (ja) * | 1983-08-19 | 1985-03-08 | Rohm Co Ltd | 半導体装置の製造方法 |
| US6551749B1 (en) | 1999-04-09 | 2003-04-22 | Fujitsu Limited | Developer and method for forming resist pattern and photomask produced by use thereof |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5359367A (en) * | 1976-11-10 | 1978-05-29 | Hitachi Ltd | Formation of electron beam resist image |
| JPS53138676A (en) * | 1977-05-06 | 1978-12-04 | Allied Chem | Method of developing photoresist |
-
1979
- 1979-05-22 JP JP6222679A patent/JPS55155353A/ja active Granted
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5359367A (en) * | 1976-11-10 | 1978-05-29 | Hitachi Ltd | Formation of electron beam resist image |
| JPS53138676A (en) * | 1977-05-06 | 1978-12-04 | Allied Chem | Method of developing photoresist |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS56101148A (en) * | 1980-01-16 | 1981-08-13 | Toshiba Corp | Photoresist developing method |
| JPS592043A (ja) * | 1982-06-29 | 1984-01-07 | Fujitsu Ltd | フオトレジストの現像方法 |
| JPS6043826A (ja) * | 1983-08-19 | 1985-03-08 | Rohm Co Ltd | 半導体装置の製造方法 |
| US6551749B1 (en) | 1999-04-09 | 2003-04-22 | Fujitsu Limited | Developer and method for forming resist pattern and photomask produced by use thereof |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0238942B2 (enrdf_load_stackoverflow) | 1990-09-03 |
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