JPS551543A - Glow discharge apparatus for emission spectrochemical analysis - Google Patents

Glow discharge apparatus for emission spectrochemical analysis

Info

Publication number
JPS551543A
JPS551543A JP7444778A JP7444778A JPS551543A JP S551543 A JPS551543 A JP S551543A JP 7444778 A JP7444778 A JP 7444778A JP 7444778 A JP7444778 A JP 7444778A JP S551543 A JPS551543 A JP S551543A
Authority
JP
Japan
Prior art keywords
auxiliary electrode
sample
cathode
glow discharge
flange
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP7444778A
Other languages
Japanese (ja)
Other versions
JPS5923381B2 (en
Inventor
Nobuo Nakamura
Shigemi Furubiki
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Holdings Corp
Original Assignee
Matsushita Electric Industrial Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electric Industrial Co Ltd filed Critical Matsushita Electric Industrial Co Ltd
Priority to JP7444778A priority Critical patent/JPS5923381B2/en
Publication of JPS551543A publication Critical patent/JPS551543A/en
Publication of JPS5923381B2 publication Critical patent/JPS5923381B2/en
Expired legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/66Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light electrically excited, e.g. electroluminescence
    • G01N21/67Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light electrically excited, e.g. electroluminescence using electric arcs or discharges

Landscapes

  • Health & Medical Sciences (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)

Abstract

PURPOSE:To make possible analysis of insulation material through the utilization of glow discharge and widen the range of application by providing an auxiliary electrode having through-holes to the cathode part between the anode part and the sample to be measured. CONSTITUTION:The inner sample contact part 3a of a cathode flange 3 is machined to disc form and an auxiliary electrode 12 of mesh form by metal wires of high purity, e.g., Ni wires or the like is fixed to the machined part of the flange 3. The sample 4 to be analyzed is put parallel to this auxiliary electrode 12 and is fixed to the cathode flange 3 to maintain a vacuum system. When a DC voltage is subsequently applied between the anode cylinder part 7 and auxiliary electrode 12, glow discharge initiates and a part of the sample 4 face being a cathode part and simultaneously an insulator is also spattered. Removing the components of the auxiliary electrode 12 from the spectra obtainted in this way makes possible the composition analysis of the sample 4 to be analyzed. Particularly if the auxiliary electrode 12 is made in mesh form, stable discharge is obtainable over the entire sample 4 face.
JP7444778A 1978-06-19 1978-06-19 Glow discharge device for emission spectrometry Expired JPS5923381B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP7444778A JPS5923381B2 (en) 1978-06-19 1978-06-19 Glow discharge device for emission spectrometry

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP7444778A JPS5923381B2 (en) 1978-06-19 1978-06-19 Glow discharge device for emission spectrometry

Publications (2)

Publication Number Publication Date
JPS551543A true JPS551543A (en) 1980-01-08
JPS5923381B2 JPS5923381B2 (en) 1984-06-01

Family

ID=13547492

Family Applications (1)

Application Number Title Priority Date Filing Date
JP7444778A Expired JPS5923381B2 (en) 1978-06-19 1978-06-19 Glow discharge device for emission spectrometry

Country Status (1)

Country Link
JP (1) JPS5923381B2 (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5954840U (en) * 1982-09-21 1984-04-10 セイコーインスツルメンツ株式会社 Glow discharge device for emission spectrometry
US5028133A (en) * 1989-12-14 1991-07-02 Regie Nationale Des Usines Renault Process and device for analysis of nonconductive surfaces
US10859502B2 (en) 2017-03-15 2020-12-08 Horiba, Ltd. Method and tool for producing sample containing object, method for performing glow discharge optical emission spectrometry, and glow discharge optical emission spectrometer
CN113053720A (en) * 2021-03-13 2021-06-29 厦门大学 Glow discharge excitation light source device

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5954840U (en) * 1982-09-21 1984-04-10 セイコーインスツルメンツ株式会社 Glow discharge device for emission spectrometry
US5028133A (en) * 1989-12-14 1991-07-02 Regie Nationale Des Usines Renault Process and device for analysis of nonconductive surfaces
US10859502B2 (en) 2017-03-15 2020-12-08 Horiba, Ltd. Method and tool for producing sample containing object, method for performing glow discharge optical emission spectrometry, and glow discharge optical emission spectrometer
CN113053720A (en) * 2021-03-13 2021-06-29 厦门大学 Glow discharge excitation light source device

Also Published As

Publication number Publication date
JPS5923381B2 (en) 1984-06-01

Similar Documents

Publication Publication Date Title
ES467062A1 (en) Bipolar electrode
JPS57201527A (en) Ion implantation method
JPS5367972A (en) Electrode for elctric discharge lamp
JPS551543A (en) Glow discharge apparatus for emission spectrochemical analysis
GB1528128A (en) Electron gun assembly
JPS524163A (en) Electric field radiation cathode
JPS5523454A (en) Lead auger analyzer
SU1670430A1 (en) Spectral lamp with replaceable cathode
JPS5587069A (en) Detector for radiation
JPS5324783A (en) Breakdown voltage goodness or not analyzing method
JPS5444589A (en) Glow discharger and using method of the same
JP3284186B2 (en) Glow discharge emission spectroscopy sample, method for producing the same, and glow discharge emission spectrometer
JPS57202057A (en) Flash discharge lamp
JPS5538946A (en) Sputtering apparatus
JPS5594473A (en) Ion plating apparatus for multi-component coating
JPS55137663A (en) Atomic spectrum light source
JPS58197647A (en) Method of ionization
JPS5464873A (en) Lighting tube
DE1905318A1 (en) Double-shell cathode for hollow cathode lamps to generate bright atomic and molecular spectra
JPS58161851A (en) Glow discharge apparatus for emission spectrochemical analysis
JPS5278363A (en) Manufacture of in-line type electronic gun
JPS5549851A (en) Ion source for metal
JPS5513817A (en) Ionization chamber type x-ray detector
Ikegami et al. A metal ion source for the cyclotron has been developed to accelerate metal ions in the cyclotron. The structure and function of this source were already described before. I) In this report we describe production and acceleration of several metal ions (Li2+, Be 3+, and B3+) in the cyclotron. As the materials to charge, single crystal of LiF, single crystal of B2 3, boron nitride and
JPS5687809A (en) Preparation of reference board for radiation thickness meter