JPS55150262A - Package for semiconductor device - Google Patents

Package for semiconductor device

Info

Publication number
JPS55150262A
JPS55150262A JP5785279A JP5785279A JPS55150262A JP S55150262 A JPS55150262 A JP S55150262A JP 5785279 A JP5785279 A JP 5785279A JP 5785279 A JP5785279 A JP 5785279A JP S55150262 A JPS55150262 A JP S55150262A
Authority
JP
Japan
Prior art keywords
pad
measuring
main surface
semiconductor device
testing
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP5785279A
Other languages
Japanese (ja)
Inventor
Norio Honda
Kunihiko Hayashi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP5785279A priority Critical patent/JPS55150262A/en
Publication of JPS55150262A publication Critical patent/JPS55150262A/en
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L22/00Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/4805Shape
    • H01L2224/4809Loop shape
    • H01L2224/48091Arched

Landscapes

  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)

Abstract

PURPOSE:To connect a small area pad for soldering a semiconductor device formed on the one main surface opposed with the side surface of an inverted leadless package through a cutout groove to a large area measuring pad formed on the other main surface thereof and easily measure for testing. CONSTITUTION:A semiconductor element 1 is secured to the interior of a ceramic substrate 1, and connected through a connecting wire 3 to a bonding pad 4. A conductive layer 6 for connecting the pad 4 to the soldering pad 7 is led, and connected through the surface of a cutout groove 8 for measuring the substrate 1 to the main surface formed on the pad 7 and to the pad 9 for measuring on the other main surface. According to this configuration, since large area measuring pad can be employed, it can alleviate the problem of the displacement of the position of the measuring probe to easily conduct a testing.
JP5785279A 1979-05-11 1979-05-11 Package for semiconductor device Pending JPS55150262A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP5785279A JPS55150262A (en) 1979-05-11 1979-05-11 Package for semiconductor device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP5785279A JPS55150262A (en) 1979-05-11 1979-05-11 Package for semiconductor device

Publications (1)

Publication Number Publication Date
JPS55150262A true JPS55150262A (en) 1980-11-22

Family

ID=13067509

Family Applications (1)

Application Number Title Priority Date Filing Date
JP5785279A Pending JPS55150262A (en) 1979-05-11 1979-05-11 Package for semiconductor device

Country Status (1)

Country Link
JP (1) JPS55150262A (en)

Similar Documents

Publication Publication Date Title
KR930022510A (en) Method of manufacturing a semiconductor device having only test contacts
US9823279B2 (en) Current sensing using a metal-on-passivation layer on an integrated circuit die
KR930001365A (en) Composite flip chip semiconductor device, fabrication and burn-in method
KR870010628A (en) Semiconductor devices
JPS5461975A (en) Detector of differential pressure, pressure and load
JPS5675626A (en) Distance measuring device
JPS55150262A (en) Package for semiconductor device
JPS5651851A (en) Semiconductor device
JPS5619634A (en) Semiconductor device
JPH05144895A (en) Probe card
JPS5688343A (en) Multichip type semiconductor package
JPS58182237A (en) Semiconductor integrated circuit
JPS6486536A (en) Semiconductor device
JPS57186383A (en) Semiconductor laser device
JPS5640268A (en) Semiconductor device
JPS57114866A (en) Measuring device of semiconductor device
JPS6453568A (en) Semiconductor package
JPS6020938Y2 (en) Parts for semiconductor integrated circuits
JPS6461923A (en) Surface mounting for semiconductor element
JPS56138934A (en) Testing device
JPS6467931A (en) Integrated circuit
JPS6225433A (en) Semiconductor element characteristic measuring device
JPS5655831A (en) Mounting method for pressure-sensor assembly
JPH0220034A (en) Semiconductor device
JPH01124245A (en) Structure for accommodation of integrated circuit