JPS55142484A - Memory circuit unit - Google Patents
Memory circuit unitInfo
- Publication number
- JPS55142484A JPS55142484A JP4956079A JP4956079A JPS55142484A JP S55142484 A JPS55142484 A JP S55142484A JP 4956079 A JP4956079 A JP 4956079A JP 4956079 A JP4956079 A JP 4956079A JP S55142484 A JPS55142484 A JP S55142484A
- Authority
- JP
- Japan
- Prior art keywords
- information
- defection
- circuits
- feti
- fet
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C17/00—Read-only memories programmable only once; Semi-permanent stores, e.g. manually-replaceable information cards
- G11C17/08—Read-only memories programmable only once; Semi-permanent stores, e.g. manually-replaceable information cards using semiconductor devices, e.g. bipolar elements
- G11C17/10—Read-only memories programmable only once; Semi-permanent stores, e.g. manually-replaceable information cards using semiconductor devices, e.g. bipolar elements in which contents are determined during manufacturing by a predetermined arrangement of coupling elements, e.g. mask-programmable ROM
- G11C17/12—Read-only memories programmable only once; Semi-permanent stores, e.g. manually-replaceable information cards using semiconductor devices, e.g. bipolar elements in which contents are determined during manufacturing by a predetermined arrangement of coupling elements, e.g. mask-programmable ROM using field-effect devices
Landscapes
- Techniques For Improving Reliability Of Storages (AREA)
- Read Only Memory (AREA)
- For Increasing The Reliability Of Semiconductor Memories (AREA)
Abstract
PURPOSE:To enable to prevent mis-output without large scale and complicated processing, by providing the two systems using two memory circuits and two defection detecting circuits. CONSTITUTION:The unit consists of the memory circuits M, M' made of MOSFETs and defection detecting circuits 31, 32. If the circuit M has a failure of output line nonshort circuit, the information of 1 is given to the output lines A, A' of the circuits M, M' with the timing pulse phip, and if the voltage of FETi, FET'i is the threshold voltage V1, the storage circuit 21 and the stored information SHO, SHO' are respectively obtained at 1 or at 0, 1 with the control voltage Vc, the circuits 31, 31' are conductive or nonconductive and the information SH1, SH1' are obtained at 0. If FETi, FET'i are conductive with the defection detecting voltage VD, the information of 1 or 0 stored in FETi, FET'i is read out without error. Further, if the circuit M has the output line shortage, the information stored in FETi, FET'i is read out without error. Accordingly, even if one of the memory circuits M, M' has a defection but another has no defection, no error is output to the information at the output terminal 43.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP54049560A JPS5827920B2 (en) | 1979-04-21 | 1979-04-21 | memory circuit device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP54049560A JPS5827920B2 (en) | 1979-04-21 | 1979-04-21 | memory circuit device |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS55142484A true JPS55142484A (en) | 1980-11-07 |
JPS5827920B2 JPS5827920B2 (en) | 1983-06-13 |
Family
ID=12834580
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP54049560A Expired JPS5827920B2 (en) | 1979-04-21 | 1979-04-21 | memory circuit device |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5827920B2 (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5051229A (en) * | 1982-01-28 | 1991-09-24 | United Kingdom Atomic Energy Authority | Thermally responsive trigger devices and their use in shut-down devices for nuclear reactors |
-
1979
- 1979-04-21 JP JP54049560A patent/JPS5827920B2/en not_active Expired
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5051229A (en) * | 1982-01-28 | 1991-09-24 | United Kingdom Atomic Energy Authority | Thermally responsive trigger devices and their use in shut-down devices for nuclear reactors |
Also Published As
Publication number | Publication date |
---|---|
JPS5827920B2 (en) | 1983-06-13 |
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