JPS55132949A - Defect detector - Google Patents

Defect detector

Info

Publication number
JPS55132949A
JPS55132949A JP3992879A JP3992879A JPS55132949A JP S55132949 A JPS55132949 A JP S55132949A JP 3992879 A JP3992879 A JP 3992879A JP 3992879 A JP3992879 A JP 3992879A JP S55132949 A JPS55132949 A JP S55132949A
Authority
JP
Japan
Prior art keywords
specimen
sensors
waves
nondevelopable
plural
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP3992879A
Other languages
Japanese (ja)
Inventor
Nobuo Uesugi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Tokyo Shibaura Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp, Tokyo Shibaura Electric Co Ltd filed Critical Toshiba Corp
Priority to JP3992879A priority Critical patent/JPS55132949A/en
Publication of JPS55132949A publication Critical patent/JPS55132949A/en
Pending legal-status Critical Current

Links

Landscapes

  • Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)
  • Measurement Of Velocity Or Position Using Acoustic Or Ultrasonic Waves (AREA)

Abstract

PURPOSE: To electively detect the nondevelopable defects existing in the specimen by applying stresses to the specimen, detecting its AE waves with plural sensors and determining level differences.
CONSTITUTION: Plural AE sensors 11aW11d are disposed by leaving the specified spacings on the specimen to which the specified stress is applied and the AE waves of the small amplitude continuous type generated in the defects in the specimen are received by these AE sensors. The respective output signal levels of the AE sensors are detected 13aW13d respectively and the position where the AE waves are generated are determined 16 based on the ratios thereof. As a result of this, the detection and position determination of the nondevelopable defects existing in the specimen may be readily accomplished.
COPYRIGHT: (C)1980,JPO&Japio
JP3992879A 1979-04-03 1979-04-03 Defect detector Pending JPS55132949A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP3992879A JPS55132949A (en) 1979-04-03 1979-04-03 Defect detector

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP3992879A JPS55132949A (en) 1979-04-03 1979-04-03 Defect detector

Publications (1)

Publication Number Publication Date
JPS55132949A true JPS55132949A (en) 1980-10-16

Family

ID=12566590

Family Applications (1)

Application Number Title Priority Date Filing Date
JP3992879A Pending JPS55132949A (en) 1979-04-03 1979-04-03 Defect detector

Country Status (1)

Country Link
JP (1) JPS55132949A (en)

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