JPS55132166A - Test system for subscriber's circuit of remote station - Google Patents

Test system for subscriber's circuit of remote station

Info

Publication number
JPS55132166A
JPS55132166A JP3913979A JP3913979A JPS55132166A JP S55132166 A JPS55132166 A JP S55132166A JP 3913979 A JP3913979 A JP 3913979A JP 3913979 A JP3913979 A JP 3913979A JP S55132166 A JPS55132166 A JP S55132166A
Authority
JP
Japan
Prior art keywords
station
test
testing
circuits
subscriber
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP3913979A
Other languages
Japanese (ja)
Inventor
Akio Inoue
Tadatoshi Fujiwara
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp, Nippon Electric Co Ltd filed Critical NEC Corp
Priority to JP3913979A priority Critical patent/JPS55132166A/en
Publication of JPS55132166A publication Critical patent/JPS55132166A/en
Pending legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04M—TELEPHONIC COMMUNICATION
    • H04M3/00—Automatic or semi-automatic exchanges
    • H04M3/22—Arrangements for supervision, monitoring or testing
    • H04M3/26—Arrangements for supervision, monitoring or testing with means for applying test signals or for measuring
    • H04M3/28—Automatic routine testing ; Fault testing; Installation testing; Test methods, test equipment or test arrangements therefor
    • H04M3/30—Automatic routine testing ; Fault testing; Installation testing; Test methods, test equipment or test arrangements therefor for subscriber's lines, for the local loop
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04M—TELEPHONIC COMMUNICATION
    • H04M3/00—Automatic or semi-automatic exchanges
    • H04M3/22—Arrangements for supervision, monitoring or testing
    • H04M3/26—Arrangements for supervision, monitoring or testing with means for applying test signals or for measuring
    • H04M3/28—Automatic routine testing ; Fault testing; Installation testing; Test methods, test equipment or test arrangements therefor
    • H04M3/30—Automatic routine testing ; Fault testing; Installation testing; Test methods, test equipment or test arrangements therefor for subscriber's lines, for the local loop
    • H04M3/301—Circuit arrangements at the subscriber's side of the line

Landscapes

  • Engineering & Computer Science (AREA)
  • Signal Processing (AREA)
  • Monitoring And Testing Of Exchanges (AREA)

Abstract

PURPOSE:To make it possible to reduce testing circuits by centralizing testing circuit of a master test station via the main link of an exchange. CONSTITUTION:Testing outgoing trunks TSTOGT0-TSTOGTn corresponding to remote tested stations B0-Bn of master test station A are installed in line link frame LLF of main link switch frame SWF, and testing circuits T0-Tm of test boards TBD0-TBBm are also installed in trunk link frame TLF. A test board operator acquires one of circuits T0-Tm and sends, for example, the station number of tested station B0 and the telephone number of tested test subscriber SUB. Incoming register IR of test board A actuates masker MKR, which acquires TSTOGT0 corresponding to station B0. Next, the number of the tested subscriber is sent out from outgoing sensor OS to station B0. Incoming register IR of station B0 receives the subscriber's number by way of testing trunk TSTICT and makes a connection to SUB via main link SWF under MKR control. Therefore, testing circuits are required only as many as test boards at a maximum, reducing the number of circuits.
JP3913979A 1979-03-30 1979-03-30 Test system for subscriber's circuit of remote station Pending JPS55132166A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP3913979A JPS55132166A (en) 1979-03-30 1979-03-30 Test system for subscriber's circuit of remote station

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP3913979A JPS55132166A (en) 1979-03-30 1979-03-30 Test system for subscriber's circuit of remote station

Publications (1)

Publication Number Publication Date
JPS55132166A true JPS55132166A (en) 1980-10-14

Family

ID=12544768

Family Applications (1)

Application Number Title Priority Date Filing Date
JP3913979A Pending JPS55132166A (en) 1979-03-30 1979-03-30 Test system for subscriber's circuit of remote station

Country Status (1)

Country Link
JP (1) JPS55132166A (en)

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