JPS55125461A - Test method of semiconductor device - Google Patents

Test method of semiconductor device

Info

Publication number
JPS55125461A
JPS55125461A JP3311679A JP3311679A JPS55125461A JP S55125461 A JPS55125461 A JP S55125461A JP 3311679 A JP3311679 A JP 3311679A JP 3311679 A JP3311679 A JP 3311679A JP S55125461 A JPS55125461 A JP S55125461A
Authority
JP
Japan
Prior art keywords
lead wire
film
external lead
external
deformation
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP3311679A
Other languages
English (en)
Japanese (ja)
Other versions
JPS6311633B2 (enrdf_load_html_response
Inventor
Takehisa Sugawara
Toyokatsu Nakagawa
Junichi Yano
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP3311679A priority Critical patent/JPS55125461A/ja
Priority to EP80300354A priority patent/EP0016522B1/en
Priority to DE8080300354T priority patent/DE3061383D1/de
Publication of JPS55125461A publication Critical patent/JPS55125461A/ja
Priority to US07/126,514 priority patent/US4859614A/en
Publication of JPS6311633B2 publication Critical patent/JPS6311633B2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP3311679A 1979-02-19 1979-03-20 Test method of semiconductor device Granted JPS55125461A (en)

Priority Applications (4)

Application Number Priority Date Filing Date Title
JP3311679A JPS55125461A (en) 1979-03-20 1979-03-20 Test method of semiconductor device
EP80300354A EP0016522B1 (en) 1979-02-19 1980-02-06 Semiconductor device and method for manufacturing the same
DE8080300354T DE3061383D1 (en) 1979-02-19 1980-02-06 Semiconductor device and method for manufacturing the same
US07/126,514 US4859614A (en) 1979-02-19 1987-11-30 Method for manufacturing semiconductor device with leads adhered to supporting insulator sheet

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP3311679A JPS55125461A (en) 1979-03-20 1979-03-20 Test method of semiconductor device

Publications (2)

Publication Number Publication Date
JPS55125461A true JPS55125461A (en) 1980-09-27
JPS6311633B2 JPS6311633B2 (enrdf_load_html_response) 1988-03-15

Family

ID=12377660

Family Applications (1)

Application Number Title Priority Date Filing Date
JP3311679A Granted JPS55125461A (en) 1979-02-19 1979-03-20 Test method of semiconductor device

Country Status (1)

Country Link
JP (1) JPS55125461A (enrdf_load_html_response)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5330919A (en) * 1993-02-08 1994-07-19 Motorola, Inc. Method for electrically testing a semiconductor die using a test apparatus having an independent conductive plane

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS50152672A (enrdf_load_html_response) * 1974-05-28 1975-12-08
JPS54783U (enrdf_load_html_response) * 1977-06-06 1979-01-06

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS50152672A (enrdf_load_html_response) * 1974-05-28 1975-12-08
JPS54783U (enrdf_load_html_response) * 1977-06-06 1979-01-06

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5330919A (en) * 1993-02-08 1994-07-19 Motorola, Inc. Method for electrically testing a semiconductor die using a test apparatus having an independent conductive plane

Also Published As

Publication number Publication date
JPS6311633B2 (enrdf_load_html_response) 1988-03-15

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