JPS5511127A - Forming method for oxidation film - Google Patents
Forming method for oxidation filmInfo
- Publication number
- JPS5511127A JPS5511127A JP8298378A JP8298378A JPS5511127A JP S5511127 A JPS5511127 A JP S5511127A JP 8298378 A JP8298378 A JP 8298378A JP 8298378 A JP8298378 A JP 8298378A JP S5511127 A JPS5511127 A JP S5511127A
- Authority
- JP
- Japan
- Prior art keywords
- gas
- ionized
- source
- evaporation
- board
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/0021—Reactive sputtering or evaporation
Landscapes
- Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Engineering & Computer Science (AREA)
- Materials Engineering (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Physical Vapour Deposition (AREA)
Abstract
PURPOSE:To form a good quality oxidation film with a high speed, by generating magnetic field in vacuum vessel and also introducing O2 gas, at the time of forming thin film by ion plating method. CONSTITUTION:A fixed quantity of O2 gas is introduced in the belljar 1 through the valve 3 after exhausting the balljar 1 at a fixed vacuum degree by the vacuum pump through the duct 2. At the same time, glow discharge is caused between the evaporation source 5 and the base board 8 by the high voltage direct current source 9 and O2 gas is ionized. Also, ionized O2 gas is focused on the central plate of the belljar 1 by magnetic field generated by turning current on the focusing coil 11 and distribution density of O2 gas at the lower part of the board 8, is heightened. At the same time, current is supplied from the power source 6 for evaporation to the source 5 and the evaporation substance 4 is melted and evaporated. Accordingly, the molecule 4' of evaporated substance 4 is ionized and is reacted with ionized O2 gas distributed in the upper part of the source 5 densely and then, oxide is made. Moreover, the above oxide is forcibly adhered on the board 8 by electric field and oxide film is formed.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP8298378A JPS5511127A (en) | 1978-07-10 | 1978-07-10 | Forming method for oxidation film |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP8298378A JPS5511127A (en) | 1978-07-10 | 1978-07-10 | Forming method for oxidation film |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS5511127A true JPS5511127A (en) | 1980-01-25 |
Family
ID=13789444
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP8298378A Pending JPS5511127A (en) | 1978-07-10 | 1978-07-10 | Forming method for oxidation film |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5511127A (en) |
Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO1987002026A1 (en) * | 1984-05-28 | 1987-04-09 | Shuhara Akira | Process for producing silicon dioxide film |
JPS62287072A (en) * | 1986-06-06 | 1987-12-12 | Matsushita Electric Ind Co Ltd | Thin film forming apparatus |
US4882198A (en) * | 1986-11-26 | 1989-11-21 | Optical Coating Laboratory, Inc. | System and method for vacuum deposition of thin films |
US4951604A (en) * | 1989-02-17 | 1990-08-28 | Optical Coating Laboratory, Inc. | System and method for vacuum deposition of thin films |
US5443862A (en) * | 1992-08-28 | 1995-08-22 | Saint-Gobain Vitrage International | Process for the treatment of thin films having properties of electrical conduction and/or reflection in the infrared |
CN110767447A (en) * | 2018-07-25 | 2020-02-07 | 浙江清华柔性电子技术研究院 | Flexible energy storage film, preparation method thereof and film capacitor |
-
1978
- 1978-07-10 JP JP8298378A patent/JPS5511127A/en active Pending
Cited By (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO1987002026A1 (en) * | 1984-05-28 | 1987-04-09 | Shuhara Akira | Process for producing silicon dioxide film |
JPS62287072A (en) * | 1986-06-06 | 1987-12-12 | Matsushita Electric Ind Co Ltd | Thin film forming apparatus |
US4882198A (en) * | 1986-11-26 | 1989-11-21 | Optical Coating Laboratory, Inc. | System and method for vacuum deposition of thin films |
US4951604A (en) * | 1989-02-17 | 1990-08-28 | Optical Coating Laboratory, Inc. | System and method for vacuum deposition of thin films |
US5443862A (en) * | 1992-08-28 | 1995-08-22 | Saint-Gobain Vitrage International | Process for the treatment of thin films having properties of electrical conduction and/or reflection in the infrared |
CN110767447A (en) * | 2018-07-25 | 2020-02-07 | 浙江清华柔性电子技术研究院 | Flexible energy storage film, preparation method thereof and film capacitor |
CN110767447B (en) * | 2018-07-25 | 2021-12-14 | 浙江清华柔性电子技术研究院 | Flexible energy storage film, preparation method thereof and film capacitor |
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