JPS55110904A - Defect detecting device - Google Patents

Defect detecting device

Info

Publication number
JPS55110904A
JPS55110904A JP1886779A JP1886779A JPS55110904A JP S55110904 A JPS55110904 A JP S55110904A JP 1886779 A JP1886779 A JP 1886779A JP 1886779 A JP1886779 A JP 1886779A JP S55110904 A JPS55110904 A JP S55110904A
Authority
JP
Japan
Prior art keywords
detected
case
output power
composing unit
defects
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP1886779A
Other languages
English (en)
Other versions
JPH0157282B2 (ja
Inventor
Hajime Yoshida
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hajime Industries Ltd
Original Assignee
Hajime Industries Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hajime Industries Ltd filed Critical Hajime Industries Ltd
Priority to JP1886779A priority Critical patent/JPS55110904A/ja
Priority to US06/121,518 priority patent/US4277802A/en
Priority to CA345,974A priority patent/CA1126856A/en
Priority to DE19803006379 priority patent/DE3006379A1/de
Priority to FR8003715A priority patent/FR2449883A1/fr
Priority to GB8008765A priority patent/GB2046433B/en
Publication of JPS55110904A publication Critical patent/JPS55110904A/ja
Publication of JPH0157282B2 publication Critical patent/JPH0157282B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F1/00—Originals for photomechanical production of textured or patterned surfaces, e.g., masks, photo-masks, reticles; Mask blanks or pellicles therefor; Containers specially adapted therefor; Preparation thereof
    • G03F1/68—Preparation processes not covered by groups G03F1/20 - G03F1/50
    • G03F1/82—Auxiliary processes, e.g. cleaning or inspecting
    • G03F1/84—Inspecting
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/956—Inspecting patterns on the surface of objects
    • G01N21/95607—Inspecting patterns on the surface of objects using a comparative method

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • General Health & Medical Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Image Processing (AREA)
  • Image Analysis (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP1886779A 1979-02-20 1979-02-20 Defect detecting device Granted JPS55110904A (en)

Priority Applications (6)

Application Number Priority Date Filing Date Title
JP1886779A JPS55110904A (en) 1979-02-20 1979-02-20 Defect detecting device
US06/121,518 US4277802A (en) 1979-02-20 1980-02-14 Defect inspection system
CA345,974A CA1126856A (en) 1979-02-20 1980-02-19 Defect inspection system
DE19803006379 DE3006379A1 (de) 1979-02-20 1980-02-20 Defektpruefsystem
FR8003715A FR2449883A1 (fr) 1979-02-20 1980-02-20 Systeme de detection de defauts
GB8008765A GB2046433B (en) 1979-02-20 1980-02-20 Defect inspection system

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1886779A JPS55110904A (en) 1979-02-20 1979-02-20 Defect detecting device

Publications (2)

Publication Number Publication Date
JPS55110904A true JPS55110904A (en) 1980-08-27
JPH0157282B2 JPH0157282B2 (ja) 1989-12-05

Family

ID=11983481

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1886779A Granted JPS55110904A (en) 1979-02-20 1979-02-20 Defect detecting device

Country Status (6)

Country Link
US (1) US4277802A (ja)
JP (1) JPS55110904A (ja)
CA (1) CA1126856A (ja)
DE (1) DE3006379A1 (ja)
FR (1) FR2449883A1 (ja)
GB (1) GB2046433B (ja)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4345312A (en) * 1979-04-13 1982-08-17 Hitachi, Ltd. Method and device for inspecting the defect of a pattern represented on an article
US4538909A (en) * 1983-05-24 1985-09-03 Automation Engineering, Inc. Circuit board inspection apparatus and method
DE3612256C2 (de) * 1986-04-11 1998-05-14 Twi Tech Wissenschaftliche Ind Verfahren und Einrichtung zur optoelektronischen Qualitätskontrolle
DE3937559A1 (de) * 1989-09-02 1991-03-14 Flachglas Ag Verfahren zum ermitteln von optischen fehlern in scheiben aus einem transparenten material, insbesondere aus glas
US5648915A (en) * 1995-11-20 1997-07-15 Triangle Research & Development Corporation Soft tissue damage assessment system
US6363296B1 (en) * 1999-02-24 2002-03-26 Infineon Technologies Ag System and method for automated defect inspection of photomasks
EP1416308B1 (de) * 2002-10-31 2006-12-27 Leica Microsystems CMS GmbH Vergleichendes optisches System
EP1416309B1 (de) * 2002-10-31 2006-11-29 Leica Microsystems CMS GmbH Vergleichsmakroskop mit einem Beleuchtungssystem für Objekte
CN111604280A (zh) * 2020-04-03 2020-09-01 广州超音速自动化科技股份有限公司 一种口罩坏件剔除方法、设备及存储介质

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
BE620045A (ja) * 1961-07-11
US4110048A (en) * 1974-11-05 1978-08-29 Kawasaki Steel Corporation Method of and an apparatus for inspecting a traveling sheet material
JPS5271289A (en) * 1975-12-11 1977-06-14 Mitsubishi Electric Corp Surface inspection device
DE2720865A1 (de) * 1977-05-10 1978-11-23 Philips Patentverwaltung Anordnung zur untersuchung von objekten
JPS5419366A (en) * 1977-07-14 1979-02-14 Nippon Jidoseigyo Ltd Device for inspecting fault of pattern

Also Published As

Publication number Publication date
DE3006379A1 (de) 1980-08-21
US4277802A (en) 1981-07-07
DE3006379C2 (ja) 1988-06-01
FR2449883B1 (ja) 1983-07-29
GB2046433B (en) 1983-04-20
GB2046433A (en) 1980-11-12
CA1126856A (en) 1982-06-29
JPH0157282B2 (ja) 1989-12-05
FR2449883A1 (fr) 1980-09-19

Similar Documents

Publication Publication Date Title
JPS57211044A (en) Inspecting device
JPS5315131A (en) Detecting method for sharpness of objective image
JPS55142254A (en) Inspecting method for pattern of printed wiring board
JPS53135653A (en) Photoelectric detecting optical device
JPS55110904A (en) Defect detecting device
JPS55125439A (en) Defect inspection device
JPS5658676A (en) Inspection device
JPS57143683A (en) Drop-out color detecting device
JPS55155205A (en) Form detector
JPS57198851A (en) Inspecting device for defect of pattern
JPS55110905A (en) Defect detecting device
JPS54143168A (en) Appearance tester
JPS5244120A (en) Color information detection circuit
JPS5355983A (en) Automatic micro defect detector
JPS5670407A (en) Detecting device for photocut line
JPS52111776A (en) Indicator for object brightness distribution
JPS52110030A (en) Detector for distinctness of object image
JPS5327444A (en) Trouble shooting method and device for object detector
JPS5263751A (en) Automatic detection of translating specific pattern
JPS56143775A (en) Automatic check system for image pickup condition
JPS5530627A (en) Wire diameter meter
JPS5495141A (en) Fault detector
JPS5398871A (en) Shape inspecting apparatus
JPS5717806A (en) Bridge detection method of printed circuit board
JPS5491359A (en) Pattern detector